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參數(shù)資料
| 型號： | A75240 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | USB PORT TRANSIENT SUPPRESSORS |
| 中文描述： | USB接口瞬態(tài)抑制器 |
| 文件頁數(shù)： | 2/9頁 |
| 文件大小： | 216K |
| 代理商： | A75240 |
SLLS266F FEBRUARY 1997 REVISED JULY 2004
www.ti.com
2
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate
precautions. Failure to observe proper handling and installation procedures can cause damage.
IEC1000-4-2 COMPLIANCE LEVEL
IEC1000-4-2
COMPLIANCE
LEVEL
MAXIMUM TEST VOLTAGE
CONTACT
DISCHARGE
(kV)
AIR
DISCHARGE
(kV)
1
2
2
2
4
4
3
6
8
4
8
15
PACKAGE/ORDERING INFORMATION
PRODUCT
SUPRESSORS
TA
PACKAGE
PACKAGE
DESIGNATOR
MARKED
AS
ORDER NUMBER
WCSP4
YZB
NWP or
65220
SN65220YZBR (Reel)
SN65220YZBT (Mini Reel)
SN65220DBVR (Mini Reel)
SN65220DBVT (Mini Reel)
SN65240P (Rail)
SN65240PW (Rail)
SN65240PWR (Reel)
SN75240P (Rail)
SN75240PW (Rail)
SN75240PWR (Reel)
SN65220
1
40
°
C to 85
°
C
SOT236
DBV
SADI
DIP8
P
SN65240
2
40 C to 85 C
TSSOP8
PW
A65240
DIP8
P
SN75240
2
0 C to 70 C
TSSOP8
PW
A75240
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
UNIT
Continuous power dissipation
See Dissipation Rating Table
15 kV(2), 2 kV(3)
Electrostatic discharge
Peak power dissipation, PD(peak)
Peak forward surge current, IFSM
Peak reverse surge current, IRSM
Storage temperature range, Tstg
(1)Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade
device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is
not implied.
(2)Human Body Model Tested in accordance with JEDEC Standard 22, Test Method A114A.
(3)Charged Device Model Tested in accordance with JEDEC Standard 22, Test Method C101.
60 W
3 A
9 A
65
°
C to 150
°
C
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