tSTG Storage Temperature 鈥�65 to +150 掳C Note: *Stres" />
鍙冩暩(sh霉)璩囨枡
鍨嬭櫉锛� A42MX16-FPQG160
寤犲晢锛� Microsemi SoC
鏂囦欢闋佹暩(sh霉)锛� 57/142闋�
鏂囦欢澶�?銆�?/td> 0K
鎻忚堪锛� IC FPGA MX SGL CHIP 24K 208-PQFP
妯�(bi膩o)婧�(zh菙n)鍖呰锛� 24
绯诲垪锛� MX
杓稿叆/杓稿嚭鏁�(sh霉)锛� 125
闁€鏁�(sh霉)锛� 24000
闆绘簮闆诲锛� 3 V ~ 3.6 V锛�4.75 V ~ 5.25 V
瀹夎椤炲瀷锛� 琛ㄩ潰璨艰
宸ヤ綔婧害锛� 0°C ~ 70°C
灏佽/澶栨锛� 160-BQFP
渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁濓細 160-PQFP锛�28x28锛�
绗�1闋�绗�2闋�绗�3闋�绗�4闋�绗�5闋�绗�6闋�绗�7闋�绗�8闋�绗�9闋�绗�10闋�绗�11闋�绗�12闋�绗�13闋�绗�14闋�绗�15闋�绗�16闋�绗�17闋�绗�18闋�绗�19闋�绗�20闋�绗�21闋�绗�22闋�绗�23闋�绗�24闋�绗�25闋�绗�26闋�绗�27闋�绗�28闋�绗�29闋�绗�30闋�绗�31闋�绗�32闋�绗�33闋�绗�34闋�绗�35闋�绗�36闋�绗�37闋�绗�38闋�绗�39闋�绗�40闋�绗�41闋�绗�42闋�绗�43闋�绗�44闋�绗�45闋�绗�46闋�绗�47闋�绗�48闋�绗�49闋�绗�50闋�绗�51闋�绗�52闋�绗�53闋�绗�54闋�绗�55闋�绗�56闋�鐣�(d膩ng)鍓嶇57闋�绗�58闋�绗�59闋�绗�60闋�绗�61闋�绗�62闋�绗�63闋�绗�64闋�绗�65闋�绗�66闋�绗�67闋�绗�68闋�绗�69闋�绗�70闋�绗�71闋�绗�72闋�绗�73闋�绗�74闋�绗�75闋�绗�76闋�绗�77闋�绗�78闋�绗�79闋�绗�80闋�绗�81闋�绗�82闋�绗�83闋�绗�84闋�绗�85闋�绗�86闋�绗�87闋�绗�88闋�绗�89闋�绗�90闋�绗�91闋�绗�92闋�绗�93闋�绗�94闋�绗�95闋�绗�96闋�绗�97闋�绗�98闋�绗�99闋�绗�100闋�绗�101闋�绗�102闋�绗�103闋�绗�104闋�绗�105闋�绗�106闋�绗�107闋�绗�108闋�绗�109闋�绗�110闋�绗�111闋�绗�112闋�绗�113闋�绗�114闋�绗�115闋�绗�116闋�绗�117闋�绗�118闋�绗�119闋�绗�120闋�绗�121闋�绗�122闋�绗�123闋�绗�124闋�绗�125闋�绗�126闋�绗�127闋�绗�128闋�绗�129闋�绗�130闋�绗�131闋�绗�132闋�绗�133闋�绗�134闋�绗�135闋�绗�136闋�绗�137闋�绗�138闋�绗�139闋�绗�140闋�绗�141闋�绗�142闋�
40MX and 42MX FPGA Families
Re vi s i on 11
1 - 17
tSTG
Storage Temperature
鈥�65 to +150
掳C
Note:
*Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
Exposure to absolute maximum rated conditions for extended periods may affect device reliability. Devices
should not be operated outside the Recommended Operating Conditions.
Table 1-7
Absolute Maximum Ratings for 42MX Devices*
Symbol
Parameter
Limits
Units
VCCI
DC Supply Voltage for I/Os
鈥�0.5 to +7.0
V
VCCA
DC Supply Voltage for Array
鈥�0.5 to +7.0
V
VI
Input Voltage
鈥�0.5 to VCCI+0.5
V
VO
Output Voltage
鈥�0.5 to VCCI+0.5
V
tSTG
Storage Temperature
鈥�65 to +150
掳C
Note:
*Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
Exposure to absolute maximum rated conditions for extended periods may affect device reliability. Devices
should not be operated outside the Recommended Operating Conditions.
Table 1-8
Recommended Operating Conditions
Parameter
Commercial
Industrial
Military
Units
Temperature Range*
0 to +70
鈥�40 to +85
鈥�55 to +125
掳C
VCC (40MX)
4.75 to 5.25
4.5 to 5.5
V
VCCA (42MX)
4.75 to 5.25
4.5 to 5.5
V
VCCI (42MX)
4.75 to 5.25
4.5 to 5.5
V
Note:
*Ambient temperature (TA) is used for commercial and industrial grades; case temperature (TC) is used for
military grades.
Table 1-6
Absolute Maximum Ratings for 40MX Devices*
Symbol
Parameter
Limits
Units
鐩搁棞(gu膩n)PDF璩囨枡
PDF鎻忚堪
ACC43DRYS CONN EDGECARD 86POS .100 DIP SLD
RBB100DHAS CONN EDGE DUAL .050 R/A 200 POS
A3PE600-1PQG208 IC FPGA 600000 GATES 208-PQFP
A3PE600-1PQ208 IC FPGA 600000 GATES 208-PQFP
EP4CE30F23I7N IC CYCLONE IV FPGA 30K 484FBGA
鐩搁棞(gu膩n)浠g悊鍟�/鎶€琛�(sh霉)鍙冩暩(sh霉)
鍙冩暩(sh霉)鎻忚堪
A42MX16-FPQG208 鍔熻兘鎻忚堪:IC FPGA MX SGL CHIP 24K 208-PQFP RoHS:鏄� 椤炲垾:闆嗘垚闆昏矾 (IC) >> 宓屽叆寮� - FPGA锛堢従(xi脿n)鍫村彲绶ㄧ▼闁€闄e垪锛� 绯诲垪:MX 妯�(bi膩o)婧�(zh菙n)鍖呰:90 绯诲垪:ProASIC3 LAB/CLB鏁�(sh霉):- 閭忚集鍏冧欢/鍠厓鏁�(sh霉):- RAM 浣嶇附瑷�(j矛):36864 杓稿叆/杓稿嚭鏁�(sh霉):157 闁€鏁�(sh霉):250000 闆绘簮闆诲:1.425 V ~ 1.575 V 瀹夎椤炲瀷:琛ㄩ潰璨艰 宸ヤ綔婧害:-40°C ~ 125°C 灏佽/澶栨:256-LBGA 渚涙噳(y墨ng)鍟嗚ō(sh猫)鍌欏皝瑁�:256-FPBGA锛�17x17锛�
A42MX16-FTQ100 鍒堕€犲晢:鏈煡寤犲 鍒堕€犲晢鍏ㄧū:鏈煡寤犲 鍔熻兘鎻忚堪:40MX and 42MX FPGA Families
A42MX16-FTQ100A 鍒堕€犲晢:鏈煡寤犲 鍒堕€犲晢鍏ㄧū:鏈煡寤犲 鍔熻兘鎻忚堪:40MX and 42MX FPGA Families
A42MX16-FTQ100B 鍒堕€犲晢:鏈煡寤犲 鍒堕€犲晢鍏ㄧū:鏈煡寤犲 鍔熻兘鎻忚堪:40MX and 42MX FPGA Families
A42MX16-FTQ100ES 鍒堕€犲晢:鏈煡寤犲 鍒堕€犲晢鍏ㄧū:鏈煡寤犲 鍔熻兘鎻忚堪:40MX and 42MX FPGA Families