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參數(shù)資料
| 型號(hào)： | 935271264518 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | 4000/14000/40000 SERIES, 10 1-BIT DRIVER, TRUE OUTPUT, PBGA64 |
| 封裝： | 7 X 7 MM, 0.70 MM PITCH, PLASTIC, MO-195, SOT-746-1, TFBGA-64 |
| 文件頁(yè)數(shù)： | 6/10頁(yè) |
| 文件大小： | 62K |
| 代理商： | 935271264518 |
Philips Semiconductors
Product data
CBTV4010
10-bit DDR SDRAM mux/bus switch
2002 Feb 19
5
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
Tamb = 0 to +85 °C
UNIT
Min
Typ1
Max
VIK
Input clamp voltage
VCC = 2.3 V; II = –18 mA
—
–1.2
V
VCC = 2.5 V; VI = VCC or GND;
S
—
±100
II
Input leakage current
CC
I
CC
S = VCC
Host port
—
±100
A
S = GND for IIL (test)
DIMM port
—
±100
ICC
Quiescent supply current
VCC = 2.5 V; IO = 0, VI = VCC or GND
—
0.7
1.5
mA
Cin
Control pin capacitance
VI= 2.5 V or 0
—
1.8
3
pF
Con
Switch on capacitance
Vin= 1.5 V
—
10
pF
r 2
On-resistance
VCC = 2.5 V; VA = 0.8 V; VB = 1.0 V
16
20
30
ron2
On-resistance
VCC = 2.5 V; VA = 1.7 V; VB = 1.5 V
16
20
30
NOTES:
1. All typical values are at VCC = 2.5 V, Tamb = 25 °C
2. Measured by the current between the Host and the DIMM terminals at the indicated voltages on each side of the switch.
3. Capacitance values are measured at a of 10 MHz and a bias voltage 3 V. Capacitance is not production tested.
AC CHARACTERISTICS
SYMBOL
PARAMETER
FROM (INPUT)
TO (OUTPUT)
VCC = +2.5 V ±0.2 V
UNIT
SYMBOL
PARAMETER
FROM (INPUT)
TO (OUTPUT)
Min
Typ
Max
UNIT
tpd
Propagation delay1
HPx or xDPx
xDPx or HPx
—
140
ps
ten
enable
Sn
HPx or nDPx
1
—
2
ns
tdis
disable
Sn
HPx or nDPx
1
—
3
ns
tosk
Output skew
Any output to any output, Waveform 4
(see note 2)
—
25
50
ps
tesk
Edge skew
Difference of rising edge propagation delay
to falling edge propagation delay,
Waveform 5 (see note 2)
—
25
50
ps
NOTES:
1. The propagation delay is based on the RC time constant of the typical on–state resistance of the switch and a load capacitance, when driven
by an ideal voltage source (zero output impedance); 20
× 7 pF.
This parameter is not production tested.
2. Skew is not production tested.
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