參數(shù)資料
型號: 935269462115
廠商: NXP SEMICONDUCTORS
元件分類: 固定正電壓單路輸出LDO穩(wěn)壓器
英文描述: 4.5 V FIXED POSITIVE LDO REGULATOR, 0.2 V DROPOUT, PDSO5
封裝: PLASTIC, MO-178, SOT-23, SOT-25, SO-5
文件頁數(shù): 3/17頁
文件大?。?/td> 212K
代理商: 935269462115
Philips Semiconductors
Product data
SA57001-XX
Microminiature, low power consumption,
low dropout regulator
2003 Mar 20
11
DEFINITIONS
Line regulation is the change in output voltage caused by a change
in input line voltage. This parameter is measured using pulse
measurement techniques or under conditions of low power
dissipation so as to not significantly upset the thermal dynamics of
the device during test.
Load regulation is the change in output voltage caused by a
change in output load current and is measured in a manner which
will not cause significant heating of the device during test.
Quiescent current is that current which flows to the ground pin of
the device when the device is operated with no output current
flowing.
Ground current is that current which flows to the ground pin of the
device when the device is operated with output current flowing due
to an applied load. It is the measurement difference of input current
minus the output current.
Dropout voltage is the input/output differential voltage at which the
regulator ceases to maintain specified output regulation if the input
voltage is reduced. It is highly influenced by device junction
temperature and load current.
Output noise is the integrated output noise voltage specified over a
frequency range and expressed in nV/kHz or Vrms. It is measured
with the input voltage and output load current held constant during
test.
Current limiting is internal device circuitry incorporated to limit the
output current of the device. This feature is incorporated in the
device to protect the device against output over current conditions or
output shorts to ground.
Thermal shutdown is internal device circuitry incorporated in the
device to shut down the device when the chip temperature reaches
a specified temperature. This feature protects the device from
excessive operating temperatures that would otherwise be
catastrophic to the device. Over heating can be created by
accidental output shorts.
TEST CIRCUITS AND TEST SET-UP TABLES
SL01420
VIN
NOISE
ON/OFF
VOUT
1
3
GND
2
5
4
SA57001-XX
CN
0.01
F
CIN
0.01
F
(CERAMIC)
1.8 V
to
12 V
COUT
4.7
F
(ALUMINUM,
ELECTROLYTIC)
Figure 23. Test circuit 1.
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