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參數(shù)資料
| 型號： | 935261032118 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 通信及網(wǎng)絡(luò) |
| 英文描述： | SPECIALTY TELECOM CIRCUIT, PDSO24 |
| 封裝： | PLASTIC, SOT-340, SSOP-24 |
| 文件頁數(shù)： | 7/34頁 |
| 文件大?。?/td> | 293K |
| 代理商： | 935261032118 |
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1999 Jan 22
15
Philips Semiconductors
Product specication
Frequency Shift Keying (FSK)/Amplitude
Shift Keying (ASK) receiver
UAA3220TS
TEST INFORMATION
Tuning procedures
TUNING PROCEDURE FOR AC TESTS
1. Turn on the signal generator (fi(RF) = 433.92 or 868.35 MHz; no modulation; RF input level = 50 dBm).
2. Tune first C50 (multiplier tank circuit), second C11 (RF stage input) to obtain a peak IF voltage at pin FA.
TUNING PROCEDURE FOR ASK RECEPTION
1. Make sure that pin DEMO1 is short circuited to ground.
2. Turn on ASK modulation and check that data is appearing on the DATA output pin and proceed with the AC tests.
TUNING PROCEDURE FOR FSK RECEPTION
1. Make sure that pins DEMO1 and DEMO2 are connected by the LC tank circuit.
2. Turn on FSK modulation (
f = 10 kHz; RF input level = 103 dBm).
3. Tune C61 (or L60) (phase shifter LC tank circuit) to obtain a peak LF voltage at pin CPC.
4. Check that data is appearing on pin DATA and proceed with the AC tests.
AC test conditions
Table 2
Test signals
The reference signal level Pref for the following tests is dened as the minimum input level in dBm to give a
BER
≤ 3 × 102 (e.g. 60 bit errors per second for 2000 bits/s). All test signal levels refer to 50 load condition.
TEST
SIGNAL
FREQUENCY
(MHz)
DATA SIGNAL
MODULATION
INDEX
FREQUENCY
DEVIATION
1
433.92/868.35
1000 Hz square wave
AM (ASK)
100%
2
433.92/868.35
1000 Hz square wave
FM (FSK)
10 kHz
3
433.92/868.35
no modulation
4
433.82/868.35
no modulation
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