參數(shù)資料
型號(hào)： 935076910518
廠商： NXP SEMICONDUCTORS
元件分類： 尋呼電路
英文描述： TELECOM, PAGING RECEIVER, PQFP32
封裝： 7 X 7 MM, 1.40 MM HEIGHT, PLASTIC, SOT-358-1, LQFP-32
文件頁數(shù)： 19/46頁
文件大小： 578K
代理商： 935076910518
1996 Jan 15
26
Philips Semiconductors
Product specication
Advanced pager receiver
UAA2080
Table 6
AC test conditions (notes 1 and 2)
Notes
1. The tests are executed without load on pins TPI and TPQ.
2. All minimum and maximum values correspond to a bit error rate (BER)
≤ 3100 in the wanted signal (P1).
3. The BER measurement is started 5 ms (ton(max)) after VRE goes HIGH; BER is then measured for 100 bits
(BER
≤ 3100).
SYMBOL
PARAMETER
CONDITIONS
TEST SIGNALS
αa
adjacent channel selectivity;
Fig.12(b)
f2 =f1 ±fCS
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αa(min)
αc
co-channel rejection; Fig.12(b) f2 =f1 ± up to 3 kHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 αc(max)
αsp
spurious immunity; Fig.12(b)
f2 = 100 kHz to 2 GHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αsp( min)
αim
intermodulation immunity;
Fig.12(c)
f2 =f1 ±fcs; f3 =f1 ± 2fcs
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: unmodulated
P2 =P1 + αim(min)
generator 3: modulated test signal 2
P3 =P2
αbl
blocking immunity; Fig.12(b)
f2 =f1 ± 1 MHz
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
generator 2: modulated test signal 2
P2 =P1 + αbl(min)
foffset
frequency offset range;
Fig.12(a)
deviation =
±4.0 kHz, f1 =fi(RF) ± 2 kHz (foffset(min))
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
f
dev
deviation range; Fig.12(a)
deviation =
±2.5 to ±7 kHz; (fdev(min) to fdev(max))
generator 1: modulated test signal 1
P1 =Pi(ref) +3dB
ton
receiver turn-on time;
Fig.12(a)
note 3
generator 1: modulated test signal 1
P1 =Pi(ref) +10dB
相關(guān)PDF資料
PDF描述
935006790118 TELECOM, PAGING RECEIVER, PDSO28
935006790112 TELECOM, PAGING RECEIVER, PDSO28
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