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參數(shù)資料
| 型號： | 933858990623 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | F/FAST SERIES, OCTAL 1-BIT DRIVER, TRUE OUTPUT, PDSO24 |
| 封裝： | 7.50 MM, PLASTIC, MS-013, SOT-137-1, SO-24 |
| 文件頁數(shù)： | 7/10頁 |
| 文件大小： | 89K |
| 代理商： | 933858990623 |
Philips Semiconductors
Product specification
74F656A
Octal buffer/driver with parity, non-inverting (3-State)
2000 Jun 30
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
VCC = MIN
IO = 3mA
±10%VCC
2.4
V
VOH
High-level output voltage
VCC = MIN,
VIL = MAX
V
MIN
IOH = –3mA
±5%VCC
2.7
3.3
V
VIH = MIN
IOH = –15mA
±10%VCC
2.0
V
VO
Low level output voltage
VCC = MIN,
V
MAX
IO = 64mA
±10%VCC
0.55
V
VOL
Low-level output voltage
VIL = MAX
VIH = MIN
IOL = 64mA
±5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0.0, VI = 7.0V
100
A
Commercial
Dn
40
A
I
High-level
Commercial
range
Pl, OEn
VCC = MAX V =2 7V
20
A
IIH
High level
input current
Industrial
Dn
VCC = MAX, VI = 2.7V
80
A
Industrial
range
Pl, OEn
40
A
I
Low level input current
Dn
VCC = MAX V =0 5V
–40
A
IIL
Low-level input current
Pl, OEn
VCC = MAX, VI = 0.5V
–20
A
IOZH
Off-state current
High-level voltage applied
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state current
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
A
IOS
Short-circuit output current3
VCC = MAX
–100
–225
mA
ICCH
50
80
mA
ICC
Supply current
(total)
ICCL
VCC = MAX
78
110
mA
(total)
ICCZ
83
90
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
TEST
Tamb = +25°C,
V
=+5 0V
Tamb = 0°C to +70°C
V
=+5 0V
± 10%
Tamb = –40°C to +85°C
V
=+5 0V
± 10%
SYMBOL
PARAMETER
TEST
CONDITIONS
VCC = +5.0V
CL = 50pF,
VCC = +5.0V ± 10%
CL = 50pF,
VCC = +5.0V ± 10%
CL = 50pF,
UNIT
CONDITIONS
CL = 50pF,
RL = 500
CL = 50pF,
RL = 500
CL = 50pF,
RL = 500
MIN
TYP
MAX
MIN
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
Dn to Qn
Waveform 1
2.0
2.5
4.0
5.5
6.5
7.0
2.0
2.5
7.0
7.5
2.0
2.5
8.0
9.0
ns
tPLH
tPHL
Propagation delay
Dn to
ΣE, ΣO
Waveform 1, 2
5.5
10.0
11.0
13.0
14.5
5.5
14.0
16.5
4.5
5.5
16.5
18.0
ns
tPZH
tPZL
Output enable time to
High or Low level
Waveform 3
Waveform 4
3.5
4.0
7.0
8.0
10.5
11.0
3.5
4.5
11.5
12.0
3.0
4.0
13.0
13.5
ns
tPHZ
tPLZ
Output disable time from
High or Low level
Waveform 3
Waveform 4
1.5
2.0
4.5
5.0
8.0
1.5
2.0
9.0
1.5
10.0
ns
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