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參數(shù)資料
| 型號： | 933768990602 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | F/FAST SERIES, OCTAL 1-BIT DRIVER, TRUE OUTPUT, PDIP20 |
| 封裝： | PLASTIC, DIP-20 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大?。?/td> | 85K |
| 代理商： | 933768990602 |
Philips Semiconductors
Product specification
74F1244
Octal buffer (3-State)
1989 Apr 04
4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
IO = 3mA
±10% VCC
2.5
V
VO
High level output voltage
VCC = MIN,
VIL = MAX
IOH = –3mA
±5% VCC
2.7
3.4
V
VOH
High-level output voltage
VIL = MAX,
VIH = MIN
IO = 15mA
±10% VCC
2.0
V
IOH = –15mA
±5% VCC
2.0
V
VO
Low level output voltage
VCC = MIN,
VIL = MAX
IOL = 48mA
±10% VCC
0.38
0.55
V
VOL
Low-level output voltage
VIL = MAX,
VIH = MIN
IOL = 64mA
±5% VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–20
A
IOZH
Off-state output current,
High-level voltage applied
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
A
IOS
Short-circuit output current3
VCC = MAX
–100
–225
mA
ICCH
30
40
mA
ICC
Supply current (total)
ICCL
VCC = MAX
57
75
mA
ICCZ
43
58
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
Tamb = +25°C
VCC = +5.0V
CL = 50pF, RL = 500
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF, RL = 500
UNIT
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
Ian, Ibn to Yn
Waveform 1
2.5
2.0
4.0
5.0
5.5
7.0
2.5
2.0
6.0
7.5
ns
tPZH
tPZL
Output Enable time
to High or Low level
Waveform 2
Waveform 3
3.0
6.0
6.5
7.5
8.0
3.0
8.5
ns
tPHZ
tPLZ
Output Disable time
to High or Low level
Waveform 2
Waveform 3
2.0
4.0
5.5
2.0
6.0
ns
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