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參數(shù)資料
| 型號： | 933756800623 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | F/FAST SERIES, HEX 1-BIT DRIVER, TRUE OUTPUT, PDSO16 |
| 封裝： | 3.90 MM, PLASTIC, MS-012AC, SOT-109-1, SO-16 |
| 文件頁數(shù)： | 6/10頁 |
| 文件大小： | 82K |
| 代理商： | 933756800623 |
Philips Semiconductors
Product specification
74F365, 74F367
Hex buffers/drivers
2000 Jun 30
5
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
VCC = MIN, VIL = MAX,
"10%VCC
2.4
V
VO
High level output voltage
VCC
MIN, VIL
MAX,
VIH = MIN, IOH = –3mA
"5%VCC
2.7
3.3
V
VOH
High-level output voltage
VCC = MIN, VIL = MAX,
"10%VCC
2.0
V
VCC
MIN, VIL
MAX,
VIH = MIN, IOH = –15mA
"5%VCC
2.0
V
VO
Low level output voltage
VCC = MIN, VIL = MAX,
"10%VCC
0.55
V
VOL
Low-level output voltage
VCC = MIN, VIL
MAX,
VIH = MIN, IOL = MAX
"5%VCC
0.42
0.55
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–20
A
IOZH
Off-state output current,
High-level voltage applied
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
A
IOS
Short-circuit output current3
VCC = MAX
–100
–225
mA
ICCH
25
35
mA
ICC
Supply current (total)
74F365
74F367
ICCL
VCC = MAX
47
62
mA
74F367
ICCZ
35
48
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In
any sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
TEST
TA = +25°C
TA = -55°C to +125°C
SYMBOL
PARAMETER
TEST
CONDITIONS
VCC = +5.0V
VCC = +5.0V ± 10%
UNIT
CONDITIONS
CL = 50pF, RL = 500
MIN
TYP
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
In to Yn
74F365,
74F367
Waveform 2
2.5
4.5
5.5
6.5
7.0
2.0
7.0
7.5
ns
tPZH
tPZL
Output Enable time
to High or Low level
74F365
Waveform 3
Waveform 4
2.5
4.0
5.0
6.5
8.0
2.5
7.5
8.5
ns
tPZH
tPZL
Output Enable time
to High or Low level
74F367
Waveform 3
Waveform 4
3.0
5.5
6.5
7.5
8.5
3.0
8.5
9.0
ns
tPHZ
tPLZ
Output Disable time
from High to Low level
Waveform 3
Waveform 4
2.0
4.5
4.0
6.5
2.0
7.0
ns
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