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| 型號(hào)： | 933756730602 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 編、解碼器及復(fù)用、解復(fù)用 |
| 英文描述： | F/FAST SERIES, DUAL 4 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, PDSO16 |
| 封裝： | 3.90 MM, PLASTIC, MS-012AC, SOT-109-1, SO-16 |
| 文件頁(yè)數(shù)： | 6/10頁(yè) |
| 文件大?。?/td> | 80K |
| 代理商： | 933756730602 |
Philips Semiconductors
Product specification
74F253
Dual 4-input multiplexer (3-State)
1988 Nov 29
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
UNIT
VO
High level output voltage
VCC = MIN, VIL = MAX,
±10%V
CC
2.4
V
VOH
High-level output voltage
CC
,
IL
,
VIH = MIN, IOH = MAX
±5%V
CC
2.7
3.3
V
VO
Low level output voltage
VCC = MIN, VIL = MAX,
±10%V
CC
0.35
0.50
V
VOL
Low-level output voltage
CC
,
IL
,
VIH = MIN, IOL = MAX
±5%V
CC
0.35
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input
voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOZH
Off-state output current
High-level voltage applied
VCC = MAX, VO = 2.7V
50
A
IOZL
Off-state output current
Low-level voltage applied
VCC = MAX, VO= 0.5V
–50
A
IOS
Short-circuit output currentNO TAG
VCC = MAX
–60
–150
mA
ICCH
OEn=GND, Sn=In=4.5V
10
16
mA
ICC
Supply current (total)
ICCL
VCC = MAX
OEn=Sn=In=GND
12
23
mA
ICCZ
OEn=4.5V, Sn=In=GND
14
23
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
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