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參數(shù)資料
| 型號： | 933740360602 |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 鎖存器 |
| 英文描述： | F/FAST SERIES, NEGATIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, PDIP16 |
| 封裝： | 0.300 INCH, PLASTIC, SOT-38-4, DIP-16 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大?。?/td> | 87K |
| 代理商： | 933740360602 |
Philips Semiconductors
Product specification
74F298
Quad 2-input multiplexer with storage
1989 Aug 14
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN
NOM
MAX
UNIT
VCC
Supply voltage
4.5
5.0
5.5
V
VIH
High-level input voltage
2.0
V
VIL
Low-level input voltage
0.8
V
IIK
Input clamp current
–18
mA
IOH
High-level output current
–1
mA
IOL
Low-level output current
20
mA
Tamb
Operating free-air temperature range
0
70
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
NO TAG
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONSNO TAG
MIN
TYP
NO TAG
MAX
UNIT
VO
High level output voltage
VCC = MIN, VIL = MAX,
±10%V
CC
2.5
V
VOH
High-level output voltage
CC
,
IL
,
VIH = MIN, IOH = –MAX
±5%V
CC
2.7
3.4
V
VO
Low level output voltage
VCC = MIN, VIL = MAX,
±10%V
CC
0.30
0.50
V
VOL
Low-level output voltage
CC
IL
,
VIH = MIN, IOL =– MAX
±5%V
CC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output currentNO TAG
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
ICCH
VCC = MAX
30
40
mA
ICC
Supply current (total)
ICCL
VCC = MAX
32
40
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
Tamb = +25°C
VCC = +5.0V
CL = 50pF
RL = 500
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF
RL = 500
UNIT
MIN
TYP
MAX
MIN
MAX
fMAX
Maximum clock frequency
Waveform
NO TAG
110
115
105
ns
tPLH
tPHL
Propagation delay
CP tp Qn
Waveform
NO TAG
4.0
4.5
5.5
6.5
7.5
8.5
4.0
4.5
9.0
9.5
ns
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