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| 型號(hào)： | 933739440602 |
| 廠(chǎng)商： | NXP SEMICONDUCTORS |
| 元件分類(lèi)： | 門(mén)電路 |
| 英文描述： | F/FAST SERIES, QUAD 2-INPUT NAND GATE, PDSO14 |
| 封裝： | 3.90 MM, PLASTIC, SOT-108-1, MS-012AB, SO-14 |
| 文件頁(yè)數(shù)： | 4/8頁(yè) |
| 文件大?。?/td> | 71K |
| 代理商： | 933739440602 |
Philips Semiconductors
Product specification
74F132
Quad 2-input NAND Schmitt trigger
1991 Jun 26
4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
VT+
Positive-going threshold
VCC = 5.0V
1.5
1.7
2.0
V
VT–
Negative-going threshold–
VCC = 5.0V
0.7
0.9
1.1
V
nVT
Hysteresis (VT+ – VT–)
VCC = 5.0V
0.4
0.8
V
VO
High level output voltage
VCC = MIN,
±10%VCC
2.5
V
VOH
High-level output voltage
VI=VT–MAX, IOH = MAX
±5%VCC
2.7
3.4
V
VO
Low level output voltage
VCC = MIN,
±10%VCC
0.30
0.50
V
VOL
Low-level output voltage
VI=VT+MAX, IOL = MAX
±5%VCC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
IT+
Input current at positive-going threshold
VCC = 5.0V, VI=VT+
0
A
IT–
Input current at negative-going threshold
VCC = 5.0V, VI=VT–
–350
A
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
ICCH
VCC = MAX
VI N= GND
8.5
12.0
mA
ICC
Supply current (total)
ICCL
VCC = MAX
VIN = 4.5V
13.0
19.5
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
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