參數(shù)資料
型號(hào): 8406602QA
廠(chǎng)商: HARRIS SEMICONDUCTOR
元件分類(lèi): 微控制器/微處理器
英文描述: MB 61C 61#20 SKT RECP
中文描述: 24 I/O, PIA-GENERAL PURPOSE, CDIP40
文件頁(yè)數(shù): 21/26頁(yè)
文件大?。?/td> 234K
代理商: 8406602QA
21
AC Test Circuit
AC Testing Input, Output Waveforms
Burn-In Circuits
FIGURE 30. WRITE TIMING
FIGURE 31. READ TIMING
Timing Waveforms
(Continued)
WR
DATA
BUS
A0-A1,
CS
tWW (9)
tDW (10)
tWD (11)
tWA (8)
tAW (7)
RD
DATA
BUS
A0-A1,
CS
tRR (3)
tRA (2)
tAR (1)
VALID
(4) tRD
tDF (5)
HIGH IMPEDANCE
R1
V1
OUTPUT FROM
DEVICE UNDER
TEST
NOTE: Includes STRAY and JIG Capacitance
TEST
POINT
C1
(SEE NOTE)
R2
TEST CONDITION DEFINITION TABLE
TEST CONDITION
V1
R1
R2
C1
1
1.7V
523
2k
750
Open
150pF
2
V
CC
1.5V
1.7k
50pF
3
Open
50pF
INPUT
VIH + 0.4V
VIL - 0.4V
1.5V
1.5V
VOH
VOL
OUTPUT
AC Testing: All AC Parameters tested as per test circuits. Input RISE and
FALL times are driven at 1ns/V.
MD82C55A CERDIP
NOTES:
1. V
CC
= 5.5V
±
0.5V
2. VIH = 4.5V
±
10%
3. VIL = -0.2V to 0.4V
4. GND = 0V
MR82C55A CLCC
NOTES:
1. C1 = 0.01
μ
F minimum
2. All resistors are 47k
±
5%
3. f0 = 100kHz
±
10%
4. f1 = f0
÷
2; f2 = f1
÷
2; . . . ; f15 = f14
÷
2
F7
F8
F9
F4
F3
GND
F0
F1
F10
F6
F7
F8
F9
F6
F7
F8
F9
F10
F6
33
34
35
36
37
38
40
32
31
30
29
24
23
25
26
27
28
21
22
13
2
3
4
5
6
7
8
9
10
11
12
14
15
16
17
18
19
20
39
1
F12
F13
F14
F2
F5
F15
F11
F12
F13
F14
F15
F11
F12
V
CC
F13
F14
F15
F11
F12
F11
C1
F10
V
C
F
F
F
F
F
F
F
F
F
GND
F0
F10
F6
F7
F8
F9
F10
F6
F1
14
13
12
11
10
9
8
7
17
16
15
2
5
30
35
39
38
37
36
33
34
32
31
29
4
6
3
1
40
41
42
43
44
28
27
26
25
24
23
22
21
20
19
18
F
F
F
F
F
F
F
F
F5
F15
F12
F13
F14
F15
F11
F12
F11
F
F
F
C1
82C55A
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