參數(shù)資料
型號(hào)： 7C433-40
廠商： Cypress Semiconductor Corp.
英文描述： 256/512/1K/2K/4K x 9 Asynchronous FIFO
中文描述： 256/512/1K/2K/4K × 9異步FIFO
文件頁數(shù)： 3/22頁
文件大?。?/td> 522K
代理商： 7C433-40
CY7C419/21/25/29/33
Document #: 38-06001 Rev. *A
Page 3 of 22
Operating Range
Range
Commercial
Industrial
Military
Ambient Temperature
[2]
0
°
C to + 70
°
C
–
40
°
C to +85
°
C
–
55
°
C to +125
°
C
V
CC
5V
±
10%
5V
±
10%
5V
±
10%
Electrical Characteristics
Over the Operating Range
[3]
7C419
–
10, 15, 30, 40
7C420/1
–
10, 15, 20, 25, 30, 40, 65
7C424/5
–
10, 15, 20, 25, 30, 40, 65
7C428/9
–
10, 15, 20, 25, 30, 40, 65
7C432/3
–
10, 15, 20, 25, 30, 40, 65
Min.
2.4
Parameter
V
OH
V
OL
V
IH
Description
Test Conditions
V
CC
= Min., I
OH
=
–
2.0 mA
V
CC
= Min., I
OL
= 8.0 mA
Max.
Unit
V
V
V
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
0.4
V
CC
V
CC
0.8
+10
+10
–
90
Com
’
l
Mil/Ind
2.0
2.2
V
IL
I
IX
I
OZ
I
OS
Input LOW Voltage
Input Leakage Current
Output Leakage Current
Output Short Circuit Current
[5]
Note 4
–
10
–
10
V
μ
A
μ
A
mA
GND < V
I
< V
CC
R > V
IH
, GND < V
O
< V
CC
V
CC
= Max., V
OUT
= GND
Electrical Characteristics
Over the Operating Range
[3]
(continued)
7C419
–
10
7C421
–
10
7C425
–
10
7C429
–
10
7C433
–
10
Min.
7C419
–
15
7C421
–
15
7C425
–
15
7C429
–
15
7C433
–
15
Min.
7C420
–
20
7C421
–
20
7C424
–
20
7C425
–
20
7C428
–
20
7C429
–
20
7C433
–
20
Min.
7C420
–
25
7C421
–
25
7C424
–
25
7C425
–
25
7C429
–
25
7C432
–
25
7C433
–
25
Min.
Parameter
I
CC
Description
Operating Current
Test Conditions
V
CC
= Max.,
I
OUT
= 0 mA
f = f
MAX
V
CC
= Max.,
I
OUT
= 0 mA
F = 20 MHz
All Inputs =
V
IH
Min.
Max.
85
Max.
65
100
Max.
55
90
Max.
50
80
Unit
mA
Com
’
l
Mil/Ind
I
CC1
Operating Current
Com
’
l
35
35
35
35
mA
I
SB1
Standby Current
Com
’
l
Mil/Ind
Com
’
l
Mil/Ind
10
10
15
5
8
10
15
5
8
10
15
5
8
mA
I
SB2
Power-Down Current All Inputs >
V
CC
–
0.2V
5
mA
Notes:
2.
3.
4.
5.
T
is the
“
instant on
”
case temperature.
See the last page of this specification for Group A subgroup testing information.
V
(Min.) =
–
2.0V for pulse durations of less than 20 ns.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
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