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參數(shù)資料
| 型號： | 74LVC541A |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Octal Transparent D-Type Latches With 3-State Outputs 20-SSOP -40 to 85 |
| 中文描述： | 八路緩沖器/線路驅(qū)動器5伏耐輸入/輸出三態(tài) |
| 文件頁數(shù)： | 4/10頁 |
| 文件大?。?/td> | 94K |
| 代理商： | 74LVC541A |
Philips Semiconductors
Product specification
74LVC541A
Octal buffer/line driver with 5-volt tolerant
inputs/outputs (3-State)
1998 Jul 29
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
2.7
1.2
0
0
0
–40
0
0
MAX
3.6
3.6
5.5
V
CC
5.5
+85
20
10
V
CC
DC supply voltage (for max. speed performance)
DC supply voltage (for low-voltage applications)
DC input voltage range
DC output voltage range; output HIGH or LOW state
DC output voltage range; output 3-State
Operating free-air temperature range
V
V
I
V
V
O
V
T
amb
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
V
I
I
OK
DC supply voltage
–0.5 to +6.5
V
DC input diode current
V
I
Note 2
0
–50
mA
DC input voltage
–0.5 to +5.5
V
DC output diode current
V
O
V
CC
or V
O
0
±
50
mA
V
DC output voltage; output HIGH or
LOW
Note 2
–0.5 to V
CC
+0.5
V
O
DC output voltage; output 3-State
Note 2
–0.5 to +6.5
I
O
DC output diode current
V
O
= 0 to V
CC
±
50
mA
I
GND
, I
CC
T
stg
DC V
CC
or GND current
Storage temperature range
±
100
mA
–60 to +150
°
C
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and
TSSOP)
P
TOT
above +70
°
C derate linearly with 8 mW/K
500
above +60
°
C derate linearly with 5.5 mW/K
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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