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參數(shù)資料
| 型號(hào)： | 74LVC244 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Octal buffer/line driver with 5-volt tolerant inputs/outputs 3-Statetitle |
| 中文描述： | 八路緩沖器/線路驅(qū)動(dòng)器5伏耐輸入/輸出3 - Statetitle |
| 文件頁(yè)數(shù)： | 4/10頁(yè) |
| 文件大?。?/td> | 96K |
| 代理商： | 74LVC244 |
Philips Semiconductors
Product specification
74LVC244A
74LVCH244A
Octal buffer/line driver with 5-volt
tolerant inputs/outputs (3-State)
1998 May 20
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
MIN
MAX
DC supply voltage (for max speed performance)
DC supply voltage (for max. speed performance)
2 7
2.7
3 6
3.6
V
CC
V
DC supply voltage (for low-voltage applications)
1.2
3.6
V
I
DC Input voltage range
0
5.5
V
V
DC Output voltage range; output HIGH or LOW
state
0
V
CC
V
O
DC output voltage range; output 3-State
0
5.5
T
amb
Operating ambient temperature range in free-air
–40
+85
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
V
I
I
OK
DC supply voltage
–0.5 to +6.5
V
DC input diode current
V
I
Note 2
0
–50
mA
DC input voltage
–0.5 to +6.5
V
DC output diode current
V
O
Note 2
V
CC
or V
O
0
50
mA
V
O
DC output voltage; output HIGH or LOW state
–0.5 to V
CC
+0.5
–0.5 to 6.5
V
DC output voltage; output 3-State
Note 2
I
O
DC output source or sink current
V
O
= 0 to V
CC
50
mA
I
GND
, I
CC
T
stg
DC V
CC
or GND current
Storage temperature range
100
mA
–65 to +150
°
C
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
P
TOT
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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