參數(shù)資料
型號: 74LV368N
廠商: NXP SEMICONDUCTORS
元件分類: 通用總線功能
英文描述: Hex buffer/line driver; inverting 3-State
中文描述: LV/LV-A/LVX/H SERIES, 6-BIT DRIVER, INVERTED OUTPUT, PDIP16
文件頁數(shù): 4/12頁
文件大?。?/td> 124K
代理商: 74LV368N
Philips Semiconductors
Product specification
74LV368
Hex buffer/line driver; inverting (3-State)
1998 May 29
4
FUNCTIONAL DIAGRAM
2
3
1A
1Y
4
5
2A
2Y
6
7
3A
3Y
10
9
4A
4Y
12
11
5A
5Y
14
13
6A
6Y
1
1OE
15
2OE
SV00376
FUNCTION TABLE
INPUTS
OUTPUT
nY
H
L
Z
nOE
L
L
H
nA
L
H
X
NOTES:
H = HIGH voltage level
L = LOW voltage level
X = Don’t care
Z = High impedance OFF-state
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V
CC
DC supply voltage
V
I
Input voltage
V
O
Output voltage
Operating ambient temperature range
in free air
PARAMETER
CONDITIONS
See Note
1
MIN
1.0
0
0
–40
–40
TYP.
3.3
MAX
3.6
V
CC
V
CC
+85
+125
500
200
100
UNIT
V
V
V
T
amb
See DC and AC
characteristics
V
CC
= 1.0V to 2.0V
V
CC
= 2.0V to 2.7V
V
CC
= 2.7V to 3.6V
°
C
t
r
, t
f
Input rise and fall times
ns/V
NOTES:
1
The LV is guaranteed to function down to V
CC
= 1.0V (input levels GND or V
CC
); DC characteristics are guaranteed from V
CC
= 1.2V to V
CC
= 3.6V.
ABSOLUTE MAXIMUM RATINGS
1, 2
In accordance with the Absolute Maximum Rating System (IEC 134); Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
V
CC
DC supply voltage
±
I
IK
DC input diode current
±
I
OK
DC output diode current
DC output source or sink current
– bus driver outputs
CONDITIONS
RATING
–0.5 to +4.6
20
50
UNIT
V
mA
mA
V
I
< –0.5 or V
I
> V
CC
+ 0.5V
V
O
< –0.5 or V
O
> V
CC
+ 0.5V
±
I
O
–0.5V < V
O
< V
CC
+ 0.5V
35
mA
±
I
GND
,
±
I
CC
T
stg
DC V
CC
or GND current for types with
–bus driver outputs
70
mA
Storage temperature range
Power dissipation per package
–plastic DIL
–plastic mini-pack (SO)
–plastic shrink mini-pack (SSOP and TSSOP)
–65 to +150
°
C
P
TOT
for temperature range: –40 to +125
°
C
above +70
°
C derate linearly with 12mW/K
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
750
500
400
mW
NOTES:
1
Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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