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參數(shù)資料
| 型號： | 74LV157PWDH |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 通用總線功能 |
| 英文描述： | Quad 2-input multiplexer |
| 中文描述： | LV/LV-A/LVX/H SERIES, QUAD 2 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, PDSO16 |
| 文件頁數(shù)： | 4/12頁 |
| 文件大小： | 117K |
| 代理商： | 74LV157PWDH |
Philips Semiconductors
Product specification
74LV157
Quad 2-input multiplexer
1998 Apr 30
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
V
CC
V
I
V
O
DC supply voltage
See Note 1
1.0
3.3
3.6
V
Input voltage
0
–
V
CC
V
CC
+85
+125
V
Output voltage
0
–
V
T
amb
Operating ambient temperature range in free air
See DC and AC
characteristics
–40
–40
°
C
t
r
, t
f
Input rise and fall times
V
CC
= 1.0V to 2.0V
V
CC
= 2.0V to 2.7V
V
CC
= 2.7V to 3.6V
–
–
–
–
–
–
500
200
100
ns/V
NOTE:
1. The LV is guaranteed to function down to V
CC
= 1.0V (input levels GND or V
CC
); DC characteristics are guaranteed from V
CC
= 1.2V to V
CC
= 3.6V.
ABSOLUTE MAXIMUM RATINGS
1, 2
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
I
IK
I
OK
DC supply voltage
–0.5 to +4.6
V
DC input diode current
V
I
< –0.5 or V
I
> V
CC
+ 0.5V
V
O
< –0.5 or V
O
> V
CC
+ 0.5V
20
mA
DC output diode current
50
mA
I
O
DC output source or sink current
– standard outputs
–0.5V < V
O
< V
CC
+ 0.5V
25
mA
I
GND
,
I
CC
T
stg
DC V
or GND current for types with
– standard outputs
50
mA
Storage temperature range
–65 to +150
°
C
P
TOT
Power dissipation per package
– plastic DIL
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
for temperature range: –40 to +125
°
C
above +70
°
C derate linearly with 12 mW/K
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
750
500
400
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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