參數(shù)資料
型號(hào): 74LV123
廠商: NXP Semiconductors N.V.
英文描述: Dual retriggerable monostable multivibrator with reset
中文描述: 雙retriggerable單穩(wěn)態(tài)觸發(fā)器的復(fù)位
文件頁(yè)數(shù): 5/16頁(yè)
文件大?。?/td> 145K
代理商: 74LV123
Philips Semiconductors
Product specification
74LV123
Dual retriggerable monostable multivibrator
with reset
1998 Apr 28
5
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
V
CC
DC supply voltage
See Note
1
1.0
3.3
5.5
V
V
I
Input voltage
0
V
CC
V
V
O
Output voltage
0
V
CC
V
T
amb
Operating ambient temperature range in free
air
See DC and AC
characteristics
–40
–40
+85
+125
°
C
t
r
, t
f
Input rise and fall times except for
Schmitt-trigger inputs
V
CC
= 1.0V to 2.0V
V
CC
= 2.0V to 2.7V
V
CC
= 2.7V to 3.6V
V
CC
= 3.6V to 5.5V
500
200
100
50
ns/V
NOTE:
1. The LV is guaranteed to function down to V
CC
= 1.0V (input levels GND or V
CC
); DC characteristics are guaranteed from V
CC
= 1.2V to V
CC
= 5.5V.
ABSOLUTE MAXIMUM RATINGS
1, 2
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0V).
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
V
CC
DC supply voltage
–0.5 to +7.0
V
I
IK
DC input diode current
V
I
< –0.5 or V
I
> V
CC
+ 0.5V
20
mA
I
OK
DC output diode current
V
O
< –0.5 or V
O
> V
CC
+ 0.5V
50
mA
I
O
DC output source or sink current
– standard outputs
–0.5V < V
O
< V
CC
+ 0.5V
25
mA
I
GND
,
CC
DC V
CC
or GND current for types with
– standard outputs
50
mA
T
stg
Storage temperature range
–65 to +150
°
C
P
TOT
Power dissipation per package
– plastic DIL
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
for temperature range: –40 to +125
°
C
above +70
°
C derate linearly with 12 mW/K
above +70
°
C derate linearly with 8 mW/K
above +60
°
C derate linearly with 5.5 mW/K
750
500
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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