
Philips Semiconductors FAST Products
Product specification
74F8960/74F8961
Octal latched bidirectional Futurebus transceivers
(3-State + open-collector)
December 19, 1990
8
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TYP.
2
UNIT
CONDITIONS
1
MIN.
MAX.
I
OH
I
OFF
High–level output current
B0 – B7
V
CC
= MAX, V
IL
= MAX, V
IH
= MIN, V
OH
= 2.1V
V
CC
= 0.0V, V
IL
= MAX, V
IH
= MIN, V
OH
= 2.1V
V
CC
= MIN,
100
μ
A
μ
A
Power–off output current
B0 – B7
100
I
OH
= –3mA, V
X
=V
CC
I
OH
= –4mA,
V
X
=3.13V and 3.47V
I
OL
= 20mA, V
X
= V
CC
I
OL
= 100mA
I
OL
= 4mA
2.5
V
CC
V
V
OH
High-level output voltage
A0 – A7
4
V
IL
= MAX, V
IH
= MIN
2.5
V
A0 – A7
4
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
V
CC
= MIN, I
I
= I
IK
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 5.5V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 2.1V, Bn – An = 0V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX, V
I
= 0.3V
0.50
V
V
OL
Low-level output voltage
B0 – B78
1.15
V
0.40
V
V
IK
Input clamp voltage
A0 – A7
-0.5
V
Except A0 – A7
-1.2
V
I
I
Input current at
maximum input voltage
OEBn, OEA, LE
A0–A7, B0 – B7
100
1
μ
A
mA
μ
A
μ
A
μ
A
μ
A
I
IH
High–level input current
OEBn, OEA, LE
20
B0–B7
100
I
IL
Low–level input current
OEBn, OEA, LE
–20
B0 – B7
–100
I
OZH
+ I
IH
Off–state output current,
high–level current applied
A0 – A7
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
OZL
+ I
IL
Off–state output current,
low–level voltage applied
A0 – A7
V
CC
= MAX, V
I
= 0.5V
–70
μ
A
I
X
High–level control current
V
CC
= MAX, V
X
= V
CC
, LE = OEA
= OEBn
=
2.7V, A0 – A7 = 2.7V, B0 – B7 = 2.0V,
–100
100
μ
A
V
CC
= MAX, V
X
= 3.13 & 3.47V, LE = OEA
=
OEBn
= A0 – A7 = 2.7V, B0 – B7 = 2.0V,
–10
10
μ
A
I
OS
Short circuit output
current
3
A0–A7
only
only
’F8960
74F8961
74F8960
V
= MAX, Bn = 1.3V, OEA = 2.0V, OEBn
=
2.7V
-60
-150
mA
V
CC
= MAX, Bn = 1.8V, OEA = 2.0V, OEBn
=
2.7V
I
CCH
I
CCL
I
CCZ
V
CC
= MAX
V
CC
= MAX, V
IL
= 0.5V
65
100
mA
I
CC
Supply current (total)
100
145
mA
75
100
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type
and function table for operating mode.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for V
IH
=1.8v and V
IL
= 1.3V.