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參數資料
| 型號： | 74F541SJ |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Octal Buffer/Line Driver with TRI-STATE Outputs |
| 中文描述： | F/FAST SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20 |
| 封裝： | 0.300 INCH, EIAJ, PLASTIC, SOIC-20 |
| 文件頁數： | 5/10頁 |
| 文件大小： | 84K |
| 代理商： | 74F541SJ |
Philips Semiconductors
Product specification
74F540, 74F541
Buffers
1990 Jan 08
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
TYP
NO TAG
MAX
UNIT
= 3mA
I
OH
= –3mA
±
10%V
CC
2.4
V
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
±
5%V
CC
2.7
3.4
V
= 15mA
I
OH
= –15mA
±
10%V
CC
2.0
V
±
5%V
CC
2.0
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
= MAX
I
OL
±
10%V
CC
0.55
V
±
5%V
CC
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input
voltage
V
CC
= 0.0V, V
I
= 7.0V
100
μ
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–20
μ
A
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
Short-circuit output current
NO TAG
V
CC
= MAX
–100
–225
mA
I
CCH
In=OEn=GND
22
30
mA
74F540
I
CCL
In=4.5V, OEn=GND
58
75
mA
I
CC
Supply current
(total)
I
CCZ
V
CC
= MAX
In=GND, OEn=4.5V
40
55
mA
I
CCH
In=4.5V, OEn=GND
30
40
mA
74F541
I
CCL
In=OEn=GND
55
72
mA
I
CCZ
In=GND, OEn=4.5V
45
58
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
should be performed last.
相關PDF資料 |
PDF描述 |
|---|---|
| 74F540 | Octal Buffer/Line Driver with TRI-STATE Outputs |
| 74F540SC | Octal Buffer/Line Driver with TRI-STATE Outputs |
| 74F540PC | Octal Buffer/Line Driver with 3-STATE Outputs |
| 74F541PC | Octal Buffer/Line Driver with 3-STATE Outputs |
| 74F541SC | Octal Buffer/Line Driver with 3-STATE Outputs |
相關代理商/技術參數 |
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