參數(shù)資料
型號: 74F539SC
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: 通用總線功能
英文描述: Dual 1-of-4 Decoder with 3-STATE Outputs
中文描述: F/FAST SERIES, OTHER DECODER/DRIVER, CONFIGURABLE OUTPUT, PDSO20
封裝: 0.300 INCH, MS-013, SOIC-20
文件頁數(shù): 3/5頁
文件大?。?/td> 44K
代理商: 74F539SC
Philips Semiconductors
Product specification
74F539
Dual 1-of-4 decoder (3-State)
1990 Feb 23
3
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
NOM
UNIT
MIN
MAX
V
CC
V
IH
V
IL
I
IK
I
OH
I
OL
T
amb
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
High-level output current
–3
mA
Low-level output current
24
mA
Operating free-air temperature range
0
70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
2.4
MAX
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN, I
OH
= MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
V
2.7
3.4
V
V
OL
Low-level output voltage
= MIN, V
V
CC
IL
= MAX,
V
IH
= MIN, I
OL
= MAX
0.35
0.50
V
0.35
0.50
V
V
IK
Input clamp voltage
Input current at maximum input
voltage
High-level input current
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
I
IL
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
20
μ
A
mA
Low-level input current
–0.6
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
3
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
35
50
mA
I
CC
Supply current
V
CC
= MAX
40
55
mA
40
60
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
should be performed last.
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