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參數(shù)資料
| 型號(hào)： | 74F456 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Octal buffer/driver with parity,non-inverting (3-State)(帶奇偶的八緩沖器/驅(qū)動(dòng)器，同相（三態(tài)）) |
| 中文描述： | 八路緩沖器/驅(qū)動(dòng)器與平等，非反相（3態(tài)）（帶奇偶的八緩沖器/驅(qū)動(dòng)器，同相（三態(tài)）） |
| 文件頁(yè)數(shù)： | 6/10頁(yè) |
| 文件大小： | 87K |
| 代理商： | 74F456 |
Philips Semiconductors
Product specification
74F456
Octal buffer/driver with parity, non-inverting (3-State)
2000 Aug 01
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
TYP
2
UNIT
MIN
MAX
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
= 3mA
I
OH
=–3mA
±
10%V
CC
2.4
V
V
OH
High-level output voltage
±
5%V
CC
2.7
3.3
V
I
OH
=–15mA
±
10%V
CC
2.0
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.55
V
±
5%V
CC
0.42
0.55
V
V
IK
I
I
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 0.0V, V
I
= 7.0V
–0.73
–1.2
V
Input current at maximum input voltage
100
μ
A
I
IH
High level input current
High-level input current
Dn
V
CC
= MAX V = 2 7V
I
= 2.7V
40
μ
A
Pl, OEn
20
μ
A
I
IL
Low level input current
Low-level input current
Dn
V
CC
= MAX V = 0 5V
I
= 0.5V
–40
μ
A
Pl, OEn
–20
μ
A
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
Short-circuit output current
3
V
CC
= MAX
–100
–225
mA
I
CCH
50
80
mA
I
CC
Supply current (total)
I
CCL
V
CC
= MAX
78
110
mA
I
CCZ
63
90
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
V
CC
= +5V
T
= +25
°
C
C
L
= 50pF, R
L
= 500
V
CC
= +5V
±
10%
T
amb
= 0
°
C to +70
°
C
C
L
L
= 500
UNIT
MIN
TYP
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
Dn to Qn
Waveform 1
2.0
2.5
4.5
5.0
6.5
7.0
2.0
2.5
7.0
7.5
ns
t
PLH
t
PHL
Propagation delay
Dn to E,
Waveform 1, 2
5.5
5.5
10.0
11.0
13.0
14.5
5.5
5.5
14.0
16.5
ns
t
PZH
t
PZL
t
PHZ
t
PLZ
Output Enable time
to High or Low level
Waveform 3
Waveform 4
2.5
4.0
4.0
8.0
8.0
10.5
2.5
4.0
9.0
11.5
ns
Output Disable time
from High or Low level
Waveform 3
Waveform 4
1.5
2.0
4.0
5.0
6.5
7.5
1.5
2.0
7.5
8.0
ns
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