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Philips Semiconductors
Product specification
74F3893
Quad Futurebus backplane transceiver
January 18, 1991
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TYP
2
UNIT
CONDITIONS
1
MIN
MAX
I
OH
V
OH
V
OHB
High–level output current
I/On
V
CC
= MAX, V
IL
= MAX, V
IH
= MIN, V
OH
= 1.5V
V
CC
= MAX, V
IL
= 1.3V, RE = 0.8V, I
OH
= MAX
V
CC
= MAX, Dn = DE = 0.8V, V
T
= 2.0V,
R
T
= 10
, RE = 2.0V
V
CC
= MIN, V
IN
= 1.8V, RE = 0.8V, I
OL
= 6mA
Dn = DE = V
IH
, I
OL
= 100mA
Dn = DE = V
IH
, I
OL
= 80mA
V
CC
= MAX or 0V,
Dn = DE = 0.8V, RE = 2.0V
10
100
μ
A
High-level output voltage
Rn
2.5
V
High-level output bus voltage
I/On
2.5
V
V
OL
V
OLB
Low-level output voltage
Rn
0.35
0.5
V
Low-level output
I/On
0.75
1.0
1.2
V
bus voltage
0.75
1.0
1.1
V
V
OCB
Driver output positive
I/On
I/On = 1mA
1.9
2.9
V
clamp voltage
I/On = 10mA
2.3
3.2
V
V
IK
I
I
I
IH
Input clamp voltage
V
CC
= MIN, I
I
=I
IK
V
CC
= MAX, V
I
= 7.0V, DE = RE = Dn = V
CC
V
CC
= MAX, DE = RE = Dn =5.5V
–0.73
-1.2
V
μ
A
μ
A
Input current at maximum input voltage
100
High–level input current
High–level I/O bus current
(power off)
Low–level input current
Dn, RE, DE
20
I
IHB
I/On
V
CC
= 0V, Dn = DE = 0.8V, I/On =1.2V, RE = 0V
100
μ
A
I
IL
Dn, RE
DE
V
CC
= MAX, V
I
= 0.5V, DE = 4.5V
V
CC
= MAX, V
I
= 0.5V, Dn = 4.5V
V
CC
= MAX, Dn = DE = 0.8V, I/On =0.75V,
RE = 0V
–40
–200
μ
A
μ
A
I
ILB
Low–level I/O bus current
(power on)
I/On
–20
20
μ
A
I
OZH
Off–state output current,
high–level voltage applied
Rn
V
CC
= MAX, V
I
= 2.7V, RE = 2V
20
μ
A
I
OZL
Off–state output current,
low–level voltage applied
V
CC
= MAX, V
I
= 0.5V, RE = 2V
–20
μ
A
I
OS
I
CC
Short circuit output current
3
Supply current
4
(total)
Rn
’F8
V
CC
= MAX
V
CC
= MAX, (RE = V
IH
or V
IL
)
-60
-150
mA
55
80
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.