參數(shù)資料
型號: 74F299
廠商: NXP Semiconductors N.V.
英文描述: 8-bit universal shift/storage register(3-State)(8位通用移位/存儲寄存器(三態(tài)))
中文描述: 8位通用移位/存儲寄存器(3態(tài))(8位通用移位/存儲寄存器(三態(tài)))
文件頁數(shù): 6/14頁
文件大小: 120K
代理商: 74F299
Philips Semiconductors
Product specification
74F299
8-bit universal shift/storage register (3-State)
1990 Mar 01
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
TYP
NO TAG
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
MAX
UNIT
Q0 Q7
Q0, Q7
= 1mA
I
OH
= –1mA
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN,
V
IL
= MAX
V
= MIN
IH
2.7
3.4
V
I/On
= 3mA
I
OH
= –3mA
2.4
V
2.7
3.3
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.35
0.50
V
±
5%V
CC
0.35
0.50
V
V
IK
I
I
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= 5.5V, V
I
= 5.5V
–0.73
–1.2
V
Input current at
In ut current at
maximum input voltage
others
100
μ
A
I/On
1
mA
I
IH
High-level input current
except
I/On
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low level input current
Low-level input current
S0, S1
V
CC
= MAX V = 0 5V
I
= 0.5V
–1.2
mA
others
–0.6
mA
I
IH +
I
OZH
Off-state output current,
High-level voltage
applied
I/On
only
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
IL +
I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
NO TAG
V
CC
= MAX, V
O
= 0.5V
–0.6
mA
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
55
60
mA
I
CC
Supply current (total)
V
CC
= MAX
70
90
mA
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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