
Philips Semiconductors
Product specification
74F2240, 74F2241
Octal buffers
December 13, 1990
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TYP
2
UNIT
CONDITIONS
1
MIN
MAX
V
CC
= MIN,
I
OH
= –3mA
±
10%V
C
±
5%V
CC
2.4
V
V
OH
High-level output voltage
V
IL
= MAX,
2.7
3.4
V
V
IH
= MIN
I
OH
=
–15mA
±
10%V
C
±
5%V
CC
2.0
V
2.0
V
V
OL
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN,
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
I
OL
= MAX
±
10%V
C
C
±
5%V
CC
0.50
V
0.42
–0.73
0.50
-1.2
100
20
–0.2
V
V
μ
A
μ
A
mA
V
IK
I
I
I
IH
I
IL
Input clamp voltage
Input current at maximum input voltage
High–level input current
Low–level input current
Off–state output current,
high–level voltage applied
Off–state output current,
low–level voltage applied
Short–circuit output current
3
I
OZH
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
V
CC
= MAX
-60
-150
35
75
45
30
65
40
mA
mA
mA
mA
mA
mA
mA
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCZ
25
53
35
19
45
27
74F2240
V
CC
= MAX
I
CC
Supply current (total)
74F2241
V
CC
= MAX
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
amb
= +25
°
C
V
CC
= +5.0V
C
L
= 50pF, R
L
= 500
MIN
TYP
3.0
2.0
3.5
3.0
3.5
5.0
2.0
1.0
2.5
3.0
2.5
4.5
3.0
3.5
5.5
2.0
1.5
3.5
T
amb
= 0
°
C to +70
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF, R
L
= 500
MIN
2.5
2.0
2.5
3.0
1.5
1.0
2.5
2.5
2.0
3.0
1.5
1.0
SYMBOL
PARAMETER
TEST
UNIT
CONDITION
MAX
7.0
5.5
7.0
8.0
6.5
5.5
7.0
6.5
7.0
7.5
6.0
6.0
MAX
8.0
6.0
8.0
9.0
7.0
5.5
8.0
7.5
8.0
8.5
7.0
6.5
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Propagation delay
Ian, Ibn to Yn
Output enable time
to high or low level
Output disable time
from high or low level
Propagation delay
Ian, Ibn to Yn
Output enable time
to high or low level
Output disable time
from high or low level
Waveform 1
5.0
ns
74F2240
Waveform 3
Waveform 4
Waveform 3
Waveform 4
4.5
ns
3.5
ns
Waveform 2
4.5
ns
74F2241
Waveform 3
Waveform 4
Waveform 3
Waveform 4
5.0
ns
4.0
ns