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參數(shù)資料
| 型號(hào)： | 74F198 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | 8-bit bidirectional universal shift register(8位雙向通用移位寄存器) |
| 中文描述： | 8位雙向通用移位寄存器（8位雙向通用移位寄存器） |
| 文件頁(yè)數(shù)： | 6/12頁(yè) |
| 文件大?。?/td> | 95K |
| 代理商： | 74F198 |
Philips Semiconductors
Product specification
74F198
8-bit bidirectional universal shift register
October 2, 1987
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN, V
IL
= MAX
±
10%V
CC
2.5
V
V
IH
= MIN, I
OH
= MAX
±
5%V
CC
2.7
3.4
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN, V
IL
= MAX
±
10%V
CC
0.35
0.50
V
V
IH
= MIN, I
OL
= MAX
±
5%V
CC
0.35
0.50
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input voltage
V
CC
= MAX, V
I
= 7.0V
100
μ
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–0.6
mA
I
OS
Short-circuit output current
3
V
CC
= MAX
–60
–150
mA
I
CC
Supply current (total)
I
CCH
V
CC
= MAX
70
100
mA
I
CCL
75
110
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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