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參數資料
| 型號： | 74F166 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | 8-bit bidirectional universal shift register |
| 中文描述： | 8位雙向通用移位寄存器 |
| 文件頁數： | 6/12頁 |
| 文件大?。?/td> | 94K |
| 代理商： | 74F166 |
Philips Semiconductors
Product specification
74F166
8-bit bidirectional universal shift register
Feb. 14, 1991
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TYP
2
UNIT
CONDITIONS
1
MIN
MAX
V
OH
High–level output voltage
V
= MIN, V
IL
=
MAX,
V
IH
= MIN
I
OH
= MAX
±
10%V
CC
±
5%V
CC
2.5
V
2.7
3.4
V
V
OL
Low–level output voltage
V
= MIN, V
IL
=
MAX,
I
OL
= MAX
±
10%V
CC
0.30
0.50
V
V
IH
= MIN
±
5%V
CC
0.30
0.50
V
V
IK
I
I
Input clamp voltage
Input current at maximum
input voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 0.0V, V
I
= 7.0V
-0.73
-1.2
100
V
μ
A
others
CE, CP
3
others
20
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
I
IH
High–level input
MR, Ds
V
CC
= MAX, V
I
= 2.7V
40
current
Industrial
others
40
only
MR, Ds
80
I
IL
Low–level input current
others
V
CC
= MAX, V
I
= 0.5V
-20
MR, Ds
-40
I
OS
Short–circuit output current
4
V
CC
= MAX
V
= MAX, PE = CE = Dn = GND,
MR = Ds = 4.5V, CP =
↑
-60
-150
mA
I
CC
Supply current (total)
50
70
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. When testing CP, CE must remain in high state, whereas CP must remain in high state when testing CE.
4. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
amb
= +25
°
C
T
amb
= 0
°
C to
+70
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF,
R
L
= 500
MIN
T
amb
= –40
°
C to +85
°
C
SYMBOL
PARAMETER
TEST
V
CC
= +5.0V
C
L
= 50pF,
R
L
= 500
MIN
TYP
V
CC
= +5.0V
±
10%
C
L
= 50pF,
R
L
= 500
MIN
UNIT
CONDITION
MAX
MAX
MAX
f
max
t
PLH
t
PHL
Maximum clock frequency
Waveform 1
135
175
110
100
ns
Propagation delay
CP to Q7
Waveform 1
5.0
4.0
7.5
6.0
10.0
8.0
5.0
3.5
12.0
9.0
5.0
3.5
13.0
9.0
ns
t
PHL
Propagation delay
MR
to Q7
Waveform 2
4.0
6.5
8.5
4.0
9.5
4.0
9.5
ns
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相關代理商/技術參數 |
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| 74F166D | 制造商:NXP Semiconductors 功能描述: |
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