參數(shù)資料
型號： 74F1245
廠商： NXP Semiconductors N.V.
英文描述： Octal transceiver 3-State
中文描述： 八路收發(fā)器三態(tài)
文件頁數(shù)： 4/10頁
文件大?。?/td> 86K
代理商： 74F1245
Philips Semiconductors
Product specification
74F1245
Octal transceiver (3-State)
1995 Mar 01
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
V
IH
V
IL
I
IK
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
I
OH
High level output current
High-level output current
A0–A7
–3
mA
B0–B7
–15
mA
I
OL
Low level output current
Low-level output current
A0–A7
24
mA
B0–B7
64
mA
T
amb
Operating free-air temperature range
0
70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
NO TAG
MIN
TYP
NO TAG
MAX
UNIT
A0–A7 B0–B7
A0–A7, B0–B7
I
OH
= –3mA
±
10% V
CC
±
5% V
CC
±
10% V
CC
±
5% V
CC
±
10% V
CC
±
5% V
CC
±
10% V
CC
±
5% V
CC
2.4
V
V
OH
High-level output voltage
High-level out ut voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
2.7
3.3
V
B0–B7
I
OH
= –15mA
2.0
V
2.0
V
A0–A7
I
OL
= 24mA
0.35
0.50
V
V
OL
Low-level output voltage
Low-level out ut voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
0.35
0.50
V
B0–B7
I
OL
= 48mA
I
OL
= 64mA
0.30
0.55
V
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 0.0V, V
I
= 7.0V
V
CC
= 0.0V, V
I
= 5.5V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
–0.73
–1.2
V
I
I
Input current at maximum
input voltage
OE, T/R
100
μ
A
μ
A
A0–A7, B0–B7
100
I
IH
I
IL
High-level input current
OE, T/R only
40
μ
A
Low-level input current
OE, T/R only
–20
μ
A
I
IH
+I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
IL
+I
OZL
Off-state output current
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–70
μ
A
I
OS
Short-circuit output
current
NO TAG
A0–A7
V
CC
= MAX
–60
–150
mA
B0–B7
–100
–225
mA
I
CCH
I
CCL
I
CCZ
120
155
mA
I
CC
Supply current (total)
V
CC
= MAX
116
150
mA
110
165
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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