- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄1887 > 73S1217F-68IMR/F/P (Maxim Integrated Products)IC SMART CARD READER PROG 68-QFN PDF資料下載
參數(shù)資料
| 型號(hào)： | 73S1217F-68IMR/F/P |
| 廠商： | Maxim Integrated Products |
| 文件頁(yè)數(shù)： | 85/93頁(yè) |
| 文件大小： | 0K |
| 描述： | IC SMART CARD READER PROG 68-QFN |
| 產(chǎn)品培訓(xùn)模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標(biāo)準(zhǔn)包裝： | 2,500 |
| 系列： | 73S12xx |
| 核心處理器： | 80515 |
| 芯體尺寸： | 8-位 |
| 速度： | 24MHz |
| 連通性： | I²C，智能卡，UART/USART，USB |
| 外圍設(shè)備： | LED，POR，WDT |
| 輸入/輸出數(shù)： | 8 |
| 程序存儲(chǔ)器容量： | 64KB（64K x 8） |
| 程序存儲(chǔ)器類型： | 閃存 |
| RAM 容量： | 2K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 2.7 V ~ 6.5 V |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 85°C |
| 封裝/外殼： | 68-VFQFN 裸露焊盤 |
| 包裝： | 帶卷 (TR) |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)第24頁(yè)第25頁(yè)第26頁(yè)第27頁(yè)第28頁(yè)第29頁(yè)第30頁(yè)第31頁(yè)第32頁(yè)第33頁(yè)第34頁(yè)第35頁(yè)第36頁(yè)第37頁(yè)第38頁(yè)第39頁(yè)第40頁(yè)第41頁(yè)第42頁(yè)第43頁(yè)第44頁(yè)第45頁(yè)第46頁(yè)第47頁(yè)第48頁(yè)第49頁(yè)第50頁(yè)第51頁(yè)第52頁(yè)第53頁(yè)第54頁(yè)第55頁(yè)第56頁(yè)第57頁(yè)第58頁(yè)第59頁(yè)第60頁(yè)第61頁(yè)第62頁(yè)第63頁(yè)第64頁(yè)第65頁(yè)第66頁(yè)第67頁(yè)第68頁(yè)第69頁(yè)第70頁(yè)第71頁(yè)第72頁(yè)第73頁(yè)第74頁(yè)第75頁(yè)第76頁(yè)第77頁(yè)第78頁(yè)第79頁(yè)第80頁(yè)第81頁(yè)第82頁(yè)第83頁(yè)第84頁(yè)當(dāng)前第85頁(yè)第86頁(yè)第87頁(yè)第88頁(yè)第89頁(yè)第90頁(yè)第91頁(yè)第92頁(yè)第93頁(yè)
73S12xxF Software User Guide
UG_12xxF_016
86
Rev. 1.50
4.5.1
EMV LEVEL I Certification Tests
The EMV compliant test suite follows the Payment System Environment specification. There are several
test labs, listed on the www.emvco.com website, qualified to perform these tests.
Currently, there are two available Protocol test suites that can be used to qualify for EMV Level I
compliance. Passing either of these suites will qualify as EMV Level I compliance. The Pseudo-CCID
code links to the two TSC libraries LAPI and HAPI which comply with both tests. However, since each
lab has its own test scripts and the test scripts differ according to the lab’s setup, the application layer
must be written and adapted specifically for each test lab’s requirements. The following subsections
describe the loopback tests that are to be written either on the host side or added to the TSC Pseudo-
CCID firmware.
4.5.1.1 EMV Test Mode
An EMV test (or session) is defined as a Command/Response pair that runs from the Activation of the
card to the Deactivation of the card. A Block Transfer may or may not occur during the session
depending on the card’s ATR response.
The host may set up the EMV PSE test environment via the USB CCID Card Control command (Escape
command). The first parameter byte (B1) of the Escape command must specifically indicate whether a
test mode is invoked and if so, it should be invoked using the MCI, VISA I or VISA II test environment.
Review the Escape command section for details about this test mode.
Following a successful Escape command, the host should start the test by sending the PowerOn
command (ScardConnect). Depending on the status of the ATR (good or bad), the host should send an
empty Block Transfer command without the APDU command (command length = 0). For example: 6F
00 00 00 00… CRC.
The test loopback will be handled by the firmware and upon completion of each test, the firmware will
respond to the host with the status, indicating whether the test session completed with a successful
return code or not. An unsuccessful return code may or may not indicate that the test failed. The test
result (test passed or test failed) is determined only by the card side.
Figure 11 depicts the minimal coding required on the host side to invoke the EMV PSE test environment.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| 73S1217F-68MR/F/PE | IC SOC SMART CARD READER 68QFN |
| 73S8010C-ILR/F | IC SMART CARD INTERFACE 28-SOIC |
| 73S8010R-ILR/F | IC SMART CARD INTERFACE 28-SOIC |
| 73S8014R-IL/F | IC SMART CARD 7816 EMV 20-SOIC |
| 73S8014RN-ILR/F | IC SMART CARD 7816 EMV 20-SOIC |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| 73S1217F-68M/F/PB | 制造商:Maxim Integrated Products 功能描述:OLD P/N 73S1217F-68IM/F/P = NEW P/N 73S1217F-68M/F/PB PIN PD - Rail/Tube |
| 73S1217F-68M/F/PE | 功能描述:8位微控制器 -MCU RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲(chǔ)器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT |
| 73S1217F-68MR/F/PE | 功能描述:8位微控制器 -MCU RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲(chǔ)器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT |
| 73S1217F-EB | 功能描述:開(kāi)發(fā)板和工具包 - 8051 73S1217F Eval Brd (Usb Cable, Doc. Cd) RoHS:否 制造商:Silicon Labs 產(chǎn)品:Development Kits 工具用于評(píng)估:C8051F960, Si7005 核心: 接口類型:USB 工作電源電壓: |
| 73S1217F-EB-Lite | 功能描述:開(kāi)發(fā)板和工具包 - 8051 73S1217F EVB Lite w/Plug & Play/Usb RoHS:否 制造商:Silicon Labs 產(chǎn)品:Development Kits 工具用于評(píng)估:C8051F960, Si7005 核心: 接口類型:USB 工作電源電壓: |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。