參數(shù)資料
型號: 5962-9551201QRA
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: DAC
英文描述: QUAD, SERIAL INPUT LOADING, 2.1 us SETTLING TIME, 8-BIT DAC, CDIP20
封裝: CERDIP-20
文件頁數(shù): 1/7頁
文件大小: 27K
代理商: 5962-9551201QRA
Original Creation Date: 08/24/95
Last Update Date: 09/29/95
Last Major Revision Date: 08/24/95
MNDAC0854CM-X REV 0B0
MILITARY DATA SHEET
QUAD 8-BIT VOLTAGE-OUTPUT SERIAL D/A CONVERTER WITH
READBACK
General Description
The DAC0854 is a complete quad 8-bit voltage-output digital-to-analog converter that can
operate on a single 5V supply. It includes on-chip output amplifiers, internal voltage
reference, and a serial microprocessor interface. By combining in one package the
reference, amplifiers and convesion circuitry for four D/A converters, the DAC0854
minimizes wiring and parts count and is hence ideally suited for applications where cost
and board space are of prime concern.
The DAC0854 also has a data readback function, which can be used by the microprocessor to
verify that the desired input word has been properly latched into the DAC0854's data
registers. The data readback function simplifies the design and reduces the cost of
systems which need to verify data integrity.
The logic comprises a MICROWIRE[TM]-compatible serial interface and control circuitry. The
interface allows the user to write to any one of the input registers or to all four at
once. The latching registers are double-buffered, consisting of 4 seperate input registers
and 4 DAC registers. Double buffering allows all 4 DAC outputs to be updated
simultaneously.
The four reference inputs allow the user to configure the system to have a separate output
voltage range for each DAC. The output voltage of each DAC can range between 0.3V and 2.8V
and is a function of Vbias, Vref, and the input word.
NS Part Numbers
DAC0854CMJ-QML
Industry Part Number
DAC0854CM
Prime Die
DAC0854C
Controlling Document
5962-9551201QRA
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1
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