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參數資料
| 型號： | 5962-8982401PA |
| 元件分類： | 基準電壓源/電流源 |
| 英文描述： | 1-OUTPUT THREE TERM VOLTAGE REFERENCE, 5 V, CDIP8 |
| 文件頁數： | 6/8頁 |
| 文件大?。?/td> | 50K |
| 代理商： | 5962-8982401PA |
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-89824
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
C
SHEET
6
DSCC FORM 2234
APR 97
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
c.
Optional subgroup 12 is used for grading the part selection at +25
°C, it is not included in PDA.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
c.
Optional subgroup 12 is used for grading the part selection at +25
°C.
4.3.2 Groups C and D inspections.
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test conditions, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
(2)
TA = +125°C, minimum.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
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相關代理商/技術參數 |
參數描述 |
|---|---|
| 59628982402PA | 制造商:AD 功能描述:New |
| 5962-8982402PA | 制造商:Analog Devices 功能描述:V-Ref Precision 5V 10mA 8-Pin CDIP Tube 制造商:Analog Devices 功能描述:V-REF PRECISION 5V 10MA 8CDIP - Rail/Tube 制造商:Analog Devices Inc. 功能描述:Voltage & Current References IC MONO 5V REFERENCE IC 制造商:Analog Devices Inc. 功能描述:Voltage & Current References IC HI PREC 5V REF |
| 5962-8982502PA | 制造商:Analog Devices 功能描述:V-Ref Precision 10V 10mA 8-Pin CDIP Tube 制造商:Analog Devices 功能描述:IC MONO 10V REFERENCE IC 制造商:Analog Devices 功能描述:V-REF PRECISION 10V 10MA 8CDIP - Rail/Tube 制造商:Analog Devices 功能描述:Voltage References IC HI PREC 10V REF |
| 5962-8982503PA | 制造商:Analog Devices 功能描述:IC MONO 10V REFERENCE IC 制造商:Analog Devices 功能描述:V-REF PRECISION 10V 10MA 8CDIP - Rail/Tube 制造商:Rochester Electronics LLC 功能描述:IC, MONO 10V REFERENCE IC - Bulk |
| 5962-8983901RA | 功能描述:SPLD - 簡單可編程邏輯器件 SMD Version of GAL16V8D 30LD/883 RoHS:否 制造商:Texas Instruments 邏輯系列:TICPAL22V10Z 大電池數量:10 最大工作頻率:66 MHz 延遲時間:25 ns 工作電源電壓:4.75 V to 5.25 V 電源電流:100 uA 最大工作溫度:+ 75 C 最小工作溫度:0 C 安裝風格:Through Hole 封裝 / 箱體:DIP-24 |
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