參數(shù)資料
型號(hào): 45DB081B
廠商: Atmel Corp.
英文描述: AT-45DB081B DATA FLASH RELIABILITY DATA
中文描述: 在- 45DB081B數(shù)據(jù)閃存可靠性數(shù)據(jù)
文件頁(yè)數(shù): 3/6頁(yè)
文件大?。?/td> 12K
代理商: 45DB081B
PAGE 3 OF 6
AT-45DB081B
PLASTIC PACKAGE
125
°C OPERATING LIFE TEST
LOT
DATE
SAMPLE
TOTAL
NUMBER
CODE
SIZE
CKT-HRS(K)
OF FAILURES
0T0280-4
0T0108
100
100.0
0
0S1954-11 0S0104
100
100.0
0
0S1955-1
0S0051
200
200.0
0
1W0370
1W0117
100
100.0
0
0ZC336-1
0Z0117
100
100.0
0
0T0814-1
0T0116
300
300.0
0
0ZG316
0Z0126
100
100.0
0
1W0359
1W0126
100
100.0
0
1W0354
1W0126
90
90.0
0
1T6007
1T0249
100
100.0
0
3H0396A
3H0334
90
90.0
0
FAILURE RATE
TOTAL DEVICE HOURS
1,380,000 DEVICE HOURS
BEST ESTIMATE
λ
= 0.05% PER 1,000 HOURS
50
°C AMBIENT
EXTRAPOLATION TO 50
°C VIA ARRHENNIUS
EQUATION AND ACTIVATION ENERGY OF
0.5eV
λ
= 0.002% PER 1,000 HOURS (17 FITS)
CONFIDENCE ESTIMATE
λ
60 = 0.002% PER 1,000 HOURS
60% CONFIDENCE (23 FITS)
λ
90 = 0.006% PER 1,000 HOURS
90% CONFIDENCE (57 FITS)
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