
2N/SST5484 Series
Vishay Siliconix
Document Number: 70246
S-50148—Rev. G, 24-Jan-05
www.vishay.com
3
SPECIFICATIONS FOR SST SERIES (TA = 25_C UNLESS OTHERWISE NOTED)
Limits
SST5484
SST5485
SST5486
Parameter
Symbol
Test Conditions
Typb
Min
Max
Min
Max
Min
Max
Unit
Static
Gate-Source
Breakdown Voltage
V(BR)GSS
IG = 1 mA , VDS = 0 V
35
25
V
Gate-Source Cutoff Voltage
VGS(off)
VDS = 15 V, ID = 10 nA
0.3
3
0.5
4
2
6
V
Saturation Drain Currentb
IDSS
VDS = 15 V, VGS = 0 V
1
5
4
10
8
20
mA
Gate Reverse Current
IGSS
VGS = 20 V, VDS = 0 V
0.002
1
nA
Gate Reverse Current
IGSS
TA = 100_C
0.2
200
nA
Gate Operating Currentc
IG
VDG = 10 V, ID = 1 mA
20
pA
Gate-Source
Forward Voltagec
VGS(F)
IG = 10 mA , VDS = 0 V
0.8
V
Dynamic
Common-Source
Forward TransconductanceNO TAG
gfs
VDS = 15 V, VGS = 0 V
3
6
3.5
7
4
8
mS
Common-Source
Output ConductanceNO TAG
VDS = 15 V, VGS = 0 V
f = 1 kHz
50
60
75
mS
Common-Source
Input Capacitance
Ciss
2.2
Common-Source
Reverse Transfer
Capacitance
Crss
VDS = 15 V, VGS = 0 V
f = 1 MHz
0.7
pF
Common-Source
Output Capacitance
Coss
1
Equivalent Input
Noise Voltagec
en
VDS = 15 V, VGS = 0 V
f = 100 Hz
10
nV
√Hz
High-Frequency
Common-Source
Yf
f = 100 MHz
5.5
mS
Common-Source
Transconductance
Yfs
f = 400 MHz
5.5
mS
Common-Source
Y
VDS = 15 V
f = 100 MHz
45
mS
Common-Source
Output Conductance
Yos
VDS = 15 V
VGS = 0 V
f = 400 MHz
65
mS
Common-Source
Yi
f = 100 MHz
0.05
mS
Common-Source
Input Conductance
Yis
f = 400 MHz
0.8
mS
Common-Source
G
VDS = 15 V, ID = 1 mA
f = 100 MHz
20
Common-Source
Power Gain
Gps
VDS = 15 V
f = 100 MHz
21
VDS = 15 V
ID = 4 mA
f = 400 MHz
13
VDS = 15 V, VGS = 0 V
RG = 1 MW, f = 1 kHz
0.3
dB
Noise Figure
NF
VDS = 15 V, ID = 1 mA
RG = 1 kW, f = 100 MHz
2
g
VDS = 15 V
ID = 4 mA
f = 100 MHz
1
ID = 4 mA
RG = 1 kW
f = 400 MHz
2.5
Notes
a.
Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
NH
b.
Pulse test: PW v300 ms duty cycle v3%.
c.
This parameter not registered with JEDEC.
d.
Not a production test.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.