參數(shù)資料
型號: 27C2048
英文描述: Evaluation Kit for the MAX3869
中文描述: 2兆位(128K的x 16位)的CMOS存儲器(173.55十一)
文件頁數(shù): 7/12頁
文件大小: 173K
代理商: 27C2048
Am27C2048
7
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
OTP Products. . . . . . . . . . . . . . . . . .
–65
°
C to +125
°
C
All Other Products . . . . . . . . . . . . . . –65
°
C to +150
°
C
Ambient Temperature
with Power Applied. . . . . . . . . . . . . . –55
°
C to +125
°
C
Voltage with Respect to V
SS
All pins except A9, V
PP
, V
CC
. . –0.6 V to V
CC
+ 0.6 V
A9 and V
PP
(Note 2) . . . . . . . . . . . . .–0.6 V to 13.5 V
V
CC
(Note 1). . . . . . . . . . . . . . . . . . . . .–0.6 V to 7.0 V
Notes:
1.
Minimum DC voltage on input or I/O pins –0.5 V During
voltage transitions, the input may overshoot V
SS
to –2.0 V
for periods of up to 20 ns. Maximum DC voltage on input
and I/O pins is V
CC
+ 5 V During voltage transitions, input
and I/O pins may overshoot to V
CC
+ 2.0 V for periods up
to 20 ns.
2. Minimum DC input voltage on A9 is –0.5 V During voltage
transitions, A9 and V
PP
may overshoot V
SS
to –2.0 V for
periods of up to 20 ns. A9 and V
PP
must not exceed+13.5
V at any time.
Stresses above those listed under “Absolute Maximum Rat-
ings” may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these
or any other conditions above those indicated in the opera-
tional sections of this specification is not implied. Exposure of
the device to absolute maximum ratings for extended periods
may affect device reliability.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (T
A
) . . . . . . . . . . .0
°
C to +70
°
C
Industrial (I) Devices
Ambient Temperature (T
A
) . . . . . . . . .
–40
°
C to +85
°
C
Extended (E) Devices
Ambient Temperature (T
A
) . . . . . . . .–55
°
C to +125
°
C
Supply Read Voltages
V
CC
for ± 5% devices . . . . . . . . . . +4.75 V to +5.25 V
V
CC
for ± 10% devices . . . . . . . . . +4.50 V to +5.50 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
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