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參數(shù)資料
| 型號(hào)： | 27C04AFT-15IL |
| 廠商： | Microchip Technology Inc. |
| 英文描述： | 4K (512 x 8) CMOS EEPROM |
| 中文描述： | 4K的（512 × 8）的CMOS EEPROM的 |
| 文件頁(yè)數(shù)： | 3/8頁(yè) |
| 文件大小： | 59K |
| 代理商： | 27C04AFT-15IL |
1996 Microchip Technology Inc.
DS11126F-page 3
28C04A
TABLE 1-3:
READ OPERATION AC CHARACTERISTICS
FIGURE 1-1:
READ WAVEFORMS
AC Testing Waveform:
Output Load:
Input Rise and Fall Times: 20 ns
Ambient Temperature:
V
1 TTL Load + 100 pF
IH
= 2.4V; V
IL
= 0.45V; V
OH
= 2.0V; V
OL
= 0.8V
Commercial (C): Tamb =
Industrial
(I):
0C to +70C
-40C to +85C
Tamb =
Parameter
Sym
28C04A-15
28C04A-20
28C04A-25
Units
Conditions
Min
Max
Min
Max
Min
Max
Address to Output Delay
t
ACC
150
200
250
ns
OE = CE = V
IL
CE to Output Delay
t
CE
150
200
250
ns
OE = V
IL
OE to Output Delay
t
OE
70
80
100
ns
CE = V
IL
CE to OE High Output Float
t
OFF
0
50
0
55
0
70
ns
Output Hold from Address, CE
or OE, whichever occurs first
t
OH
0
0
0
ns
Endurance
—
1M
—
1M
—
1M
—
cycles 25
°
C, Vcc =
5.0V, Block
Mode (Note)
Note: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific applica-
tion, please consult the Total Endurance Model which can be obtained on our BBS or website.
Address
CE
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
OE
Data
WE
V
OH
V
OL
V
IH
V
IL
Address Valid
High Z
Valid Output
t
ACC
(1) t
OFF
is specified for OE or CE, whichever occurs first
(2) OE may be delayed up to t
CE
- t
OE
after the falling edge of CE without impact on t
CE
(3) This parameter is sampled and is not 100% tested
High Z
t
OH
t
OFF(1,3)
Notes:
t
OE(2)
t
CE(2)
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| 27C04AFT-15IP | 制造商:MICROCHIP 制造商全稱:Microchip Technology 功能描述:4K (512 x 8) CMOS EEPROM |
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