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參數(shù)資料
| 型號： | 1794AFREQBN |
| 廠商： | VECTRON INTERNATIONAL |
| 元件分類： | XO, clock |
| 英文描述： | VCXO, CLOCK, 10 MHz - 40 MHz, CMOS OUTPUT |
| 文件頁數(shù)： | 3/5頁 |
| 文件大?。?/td> | 166K |
| 代理商： | 1794AFREQBN |
1794
Series
VCXO
Vectron International Custom Datasheet
Revision Date : 6-14-05 SEM
Date Printed: 2005-07-08
3/5
Vectron International LLP 100 Watts Street Mount Holly Springs, Pennsylvania 17065, USA
Tel 1-717-486-3411
Fax 1-717-486-5920
Vectron International Landstrasse D-74924 Neckarbischofsheim, Germany Tel +49-7268-801-0 Fax +49-07268-801-281 www.corningfrequency.de
TABLE II
CONSTRUCTION, SCREENING & TESTING OPTIONS
NOTE: For Engineering or Prototype VCXOs requiring basic electrical testing only and no Screening, or Groups A and
B Testing, use the code letter E .
Option Code
Operation
S
R
C
B
Design, Construction
& Component Screen
(see Mfging Section)
Mil-PRF-55310
Class S
Mil-PRF-55310
Class B
Mil-PRF-55310
Class B
Mil-PRF-55310
Class B
Workmanship
M883, Method 2017
for Class S
M883, Method 2017
for Class B
M883, Method 2017
for Class B
M883, Method 2017
for Class B
Screening
Mil-PRF-55310
Class S
Mil-PRF-55310
Class S
Mil-PRF-55310
Class B modified
Mil-PRF-55310
Class B
Non-Destruct Wire
Bond Pull
100%
N/A
Internal Visual
M883, Method 2017
for Class S
M883, Method 2017
for Class B
M883, Method 2017
for Class B
M883, Method 2017
for Class B
Stabilization Bake
48 hrs minimum @
+150 C
48 hrs minimum @
+150 C
48 hrs minimum @
+150 C
48 hrs minimum @
+150 C
Thermal Shock
M883, Method 1011,
TC A
M883, Method
1011, TC A
N/A
Temperature Cycling
M883, Method 1010,
TC B
M883, Method
1010, TC B
M883, Method 1010,
TC B
M883, Method 1010,
TC B
Constant Acceleration
M883, Method 2001,
TC A (5000 gs, Y1
Axis only)
M883, Method
2001, TC A (5000
gs, Y1 Axis only)
M883, Method 2001,
TC A (5000 gs, Y1
Axis only)
M883, Method 2001,
TC A (5000 gs, Y1
Axis only)
Seal Test
(fine & gross)
100%
PIND
M883, Method 2020,
TC B
M883, Method
2020, TC B
M883, Method 2020,
TC B
N/A
Electrical Test
Frequency, Output
levels, Input Current
@ +25 C only
Burn-In
(Powered with load)
+125 C for 240
hours
+125 C for 240
hours
+125 C for 160 hours
Electrical Test
Frequency, Output
levels, Input Current
@ +25 C & Temp
Extremes specified
in Table II
@ +25 C & Temp
Extremes specified
in Table II
@ +25 C & Temp
Extremes specified
in Table II
@ +25 C & Temp
Extremes specified
in Table II
PDA
2% applies to Input
Current @ +25 C
2% applies to Input
Current @ +25 C
10% applies to Input
Current @ +25 C
10% applies to Input
Current @ +25 C
Radiographic
M883, Method 2012
N/A
Group A
100%
Sample per
Mil-PRF-55310
Sample per
Mil-PRF-55310
Group B
(30 day Aging @
+70 C)
100%
Sample per
Mil-PRF-55310
Sample per
Mil-PRF-55310
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