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參數(shù)資料
| 型號： | 160V |
| 廠商： | Lattice Semiconductor Corporation |
| 英文描述： | In-System Programmable 3.3V Generic Digital CrosspointTM |
| 中文描述： | 在系統(tǒng)可編程3.3V的通用數(shù)字CrosspointTM |
| 文件頁數(shù)： | 17/37頁 |
| 文件大?。?/td> | 464K |
| 代理商： | 160V |
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17
Specifications
ispGDX160V
Output Low Voltage
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
I/O Active Pull-Up Current
Bus Hold Low Sustaining Current
Bus Hold High Sustaining Current
Bus Hold Low Overdrive Current
Bus Hold High Overdrive Current
Bus Hold Trip Points
Output Short Circuit Current
Quiescent Power Supply Current
Dynamic Power Supply Current
per Input Switching
Maximum Continuous I/O Pin Sink
Current Through Any GND Pin
I
OL
=24 mA
I
OH
=-12 mA
0V
≤
V
IN
≤
V
IL
(Max.)
V
CC
≤
V
IN
≤
5.25V
0V
≤
V
IN
≤
V
IL
V
IN
= V
IL
(Max.)
V
IN
= V
IH
(Min.)
0V
≤
V
IN
≤
V
CC
0V
≤
V
IN
≤
V
CC
V
CC
= 3.3V, V
OUT
= 0.5V, T
A
= 25
C
V
IL
= 0.5V, V
IH
= V
CC
One input toggling @ 50% duty cycle,
outputs open.
–
–
–
–
–
–
–
–
–
–
–
70
–
–
2.4
–
–
–
50
-50
–
–
V
IL
–
–
–
–
0.55
–
-10
10
-150
–
–
550
-550
V
IH
-250
–
–
96
Switching Test Conditions
DC Electrical Characteristics
Over Recommended Operating Conditions
V
V
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
V
mA
mA
mA/MHz
mA
V
OL
V
OH
I
IL
I
IH
I
IL-PU
I
BHLS
I
BHHS
I
BHLO
I
BHHO
I
BHT
I
OS
1
I
CCQ
4
I
CC
1. One output at a time for a maximum duration of one second. V
OUT
= 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
2. Typical values are at V
= 3.3V and T
= 25
o
C.
3. I
/ MHz = (0.01 x I/O cell fanout) + 0.04
e.g. An input driving four I/O cells at 40 MHz results in a dynamic I
of approximately ((0.01 x 4) + 0.04) x 40 = 3.2 mA.
4. For a typical application with 50% of I/O pins used as inputs, 50% used as outputs or bidirectionals.
5. This parameter limits the total current sinking of I/O pins surrounding the nearest GND pin.
SYMBOL
MIN.
MAX.
TYP.
2
PARAMETER
CONDITION
UNITS
Input Pulse Levels
GND to 3.0V
Input Rise and Fall Time
≤
1.5ns 10% to 90%
Input Timing Reference Levels
1.5V
Output Timing Reference Levels
1.5V
Output Load
See figure at right
3-state levels are measured 0.5V from steady-state
active level.
+ 3.3V
R1
R2
CL
*
Device
Output
Test
Point
*
CL includes Test Fixture and Probe Capacitance.
See
Note 3
I
CONT
5
Output Load Conditions
TEST CONDITION
R1
153
∞
153
∞
R2
134
134
∞
CL
35pF
35pF
35pF
A
B
Active High
Active Low
Active High to Z
at
V
OH
Slow Slew
C
D
153
∞
∞
∞
5pF
35pF
134
5pF
Active Low to Z
at
V
+0.5V
OL
Table 2-0004A
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