
MX877
2
06/08/06
Drawing No. 087709
www.claremicronix.com
MX877
IXYS
Absolute Maximum Ratings (Voltages with respect to GND=0V)
Parameter
Symbol
Min
Max
Unit
VPWR Supply Voltage
VPWR
62
V
Logic Supply Voltage
VCC
6
V
Input Pin Voltage
VIN
6
V
Continuous Output Current
IOUT(OUT0-7)
100
mA
Storage Temperature
TSTG
-55
150
C
o
Operating Ambient Temp
TA
-40
85
C
o
Operating Junction Temp
TJ
150
C
o
Thermal Resistance
(Junction to Ambient)
RθJA
110 Typical
C
o/W
ESD Warning
ESD (electrostatic discharge) sensitive device. Although the MX877 features proprietary ESD protection circuitry,
permanent damage may be sustained if subjected to high energy electrostatic discharges. Proper ESD precautions
are recommended to avoid performance degradation or loss of functionality.
DC Electrical Characteristics
VCC=5.0V, VPWR=42V, TA=25
oC, unless otherwise specified.
Parameter
Condition
Min
Typ
Max
Unit
Logic Supply Voltage
2.7
5.5
V
Logic Supply Current
fSCK = 5 MHz
50
A
Quiescent Logic Supply Current
fSCK = 0
1
A
VPWR Voltage
6
60
V
VPWR Current
Total of all outputs
400
mA
GND Current
Total of all outputs
400
mA
Quiescent VPWR Current
VPWR = 42V, No load
0.75
mA
High Level Input Voltage
IN0-7, SCK, SDI, OE, CS
VCC-0.5
V
Low Level Input Voltage
0.5
V
Input Leakage Current
1
A
SDO Tri-State Leakage Current
CS = Logic High
1
A
Out0-7 Current
Any one output, sink or source
80
mA
Out0-7 ON Resistance
VPWR = 42V
9
Out0-7 Tri-State Leakage Current
OE = Logic Low
1
A
Notes: To avoid unwanted output during VPWR application and system initialization, keep OE at a logic
low until CS has completed one cycle.
Thermal Resistance is measured in still air with the device soldered to a 6 square inch board
without a ground plane. Applications may require derating of the specified maximum currents to
avoid exceeding the maximum operation junction temperature.
Absolute Maximum Ratings are
stress ratings. Stresses in excess of
these ratings can cause permanent
damage to the device. Functional
operation of the device at these or
any other conditions beyond those
indicated in the operational sections
of this data sheet is not implied.
Exposure of the device to the
absolute maximum ratings for an
extended period may degrade the
device and affect its reliability.