參數(shù)資料
型號： TB5T1DR
廠商： Texas Instruments, Inc.
元件分類： 外設(shè)及接口
英文描述： Low Power 5V RS232 Dual Driver/Receiver with 0.1?μF Capacitors; Package: SO; No of Pins: 16; Temperature Range: -40?°C to 85?°C
中文描述： 電可擦除可編程邏輯器件
文件頁數(shù)： 5/17頁
文件大?。?/td> 437K
代理商： TB5T1DR
www.ti.com
RECEIVER ELECTRICAL CHARACTERISTICS
over operating free-air temperature range unless otherwise noted
DRIVER SWITCHING CHARACTERISTICS
over operating free-air temperature range unless otherwise noted
TB5T1
SLLS589B–NOVEMBER 2003–REVISED MAY 2004
PARAMETER
TEST CONDITIONS
V
CC
= 4.5 V, I
OL
= 8.0 mA
V
CC
= 4.5 V, I
OH
= -400 μA
V
CC
= 5.5 V
V
CC
= 4.5 V
V
CC
= 4.5 V, I
I
= -5 mA
n = 1 or 2
n = 1 or 2
MIN
TYP
MAX
UNIT
V
V
V
V
V
mV
mV
mV
μA
μA
mA
μA
μA
μA
mA
mA
V
OL
V
OH
V
IL
V
IH
V
IK
V
TH+
V
TH-
V
HYST
I
OZL
I
OZH
I
OS
I
IL
I
IH
I
IH
II
L
I
IH
R
O
Output low voltage
Output high voltage
Enable input low voltage
(1)
Enable input high voltage
(1)
Enable input clamp voltage
Positive-going differential input threshold voltage
(1)
Negative-going differential input threshold voltage
(1)
Differential input threshold voltage hysteresis
Off-state output low current (high Z)
Off-state output high current (high Z)
Short circuit output current
(3)
Enable input low current
Enable input high current
Enable input reverse current
Differential input low current
Differential input high current
Output resistance
0.4
2.4
0.8
2
-1
(2)
100
|V
Rin
- V
Rin
|
|V
Rin
- V
Rin
|
(V
TH+
- V
TH-
)
-100
(2)
50
V
CC
= 5.5 V, V
O
= 0.4 V
V
CC
= 5.5 V, V
O
= 2.4 V
V
CC
= 5.5 V
V
CC
= 5.5 V, V
IN
= 0.4 V
V
CC
= 5.5 V, V
IN
= 2.7 V
V
CC
= 5.5 V, V
IN
= 5.5 V
V
CC
= 5.5V, V
IN
= -1.2 V
V
CC
= 5.5V, V
IN
= 7.2 V
-20
(2)
20
-100
(2)
-400
(2)
20
100
-2
(2)
1
20
(1)
(2)
The input levels and difference voltage provide no noise immunity and should be tested only in a static, noise-free environment.
This parameter is listed using a magnitude and polarity/direction convention, rather than an algebraic convention, to match the original
Agere data sheet.
Test must be performed one lead at a time to prevent damage to the device.
(3)
PARAMETER
TEST CONDITIONS
C
L
= 5 pF, See Figure 2 and Figure 6
MIN
TYP
MAX
UNIT
ns
ns
ns/pF
ns
t
P1
t
P2
t
P
t
PHZ
Propagation delay time, input high to output
(1)
Propagation delay time, input low to output
(1)
Capacitive delay
Propagation delay time,
high-level-to-high-impedance output
Propagation delay time,
low-level-to-high-impedance output
Propagation delay time,
high-impedance-to-high-level output
Propagation delay time,
high-impedance-to-low-level output
Output skew, |t
P1
- t
P2
|
Output skew, |t
PHH
- t
PHL
|, |t
PLH
- t
PLL
|
Part-to-part skew
(2)
Output skew, difference between drivers
Rise time (20%-80%)
Fall time (80%-20%)
1.2
1.2
0.01
2
2
0.03
12
C
L
= 5 pF, See Figure 3 and Figure 6
8
t
PLZ
7
12
ns
t
PZH
4
12
ns
t
PZL
5
12
ns
t
skew1
t
skew2
t
skew(pp)
t
skew
t
TLH
t
THL
C
L
= 5 pF, See Figure 2 andFigure 6
0.15
0.15
0.1
0.3
1.1
ns
ns
ns
ns
ns
ns
1
0.3
0.7
0.7
2
2
(1)
(2)
Parameters t
and t
are measured from the 1.5 V point of the input to the crossover point of the outputs (see Figure 2).
t
is the magnitude of the difference in propagation delay times between any specified outputs of two devices when both devices
operate with the same supply voltage, at the same temperature, and have identical packages and test circuits.
5
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