
23
ICSSSTUB32866B
Advance Information
1165A—3/21/07
Notes: 1. CL incluces probe and jig capacitance.
2. IDD tested with clock and data inputs held at VDD or GND, and Io = 0mA.
3. All input pulses are supplied by generators having the following chareacteristics: PRR
≤10 MHz,
Zo=50
Ω, input slew rate = 1 V/ns ±20% (unless otherwise specified).
4. The outputs are measured one at a time with one transition per measurement.
5. VREF = VDD/2
6. VIH = VREF + 250 mV (ac voltage levels) for differential inputs. VIH = VDD for LVCMOS input.
7. VIL = VREF - 250 mV (ac voltage levels) for differential inputs. VIL = GND for LVCMOS input.
8. VID = 600 mV
9. tPLH and tPHL are the same as tPDM.
CL =30 pF
RL = 1000
Ω
DUT
Out
RL= 100
Ω
CK Inputs
TL =50
Ω
TL =350ps,50
Ω
Test Point
VDD
0V
VDD/2
LVCMOS
RST#
Input
IDD
VDD/2
tINACT
tACT
10%
90%
CK#
VICR
VID
tPLH
tPHL
Output
VOH
VOL
VICR
VTT
VOH
VOL
VIH
VIL
tRPHL
VDD/2
VTT
LVCMOS
RST#
Input
Output
VICR
VID
VICR
Input
tW
VREF
VIH
VIL
VREF
Input
VICR
VID
tSU
tH
CK#
CK
VDD
RL = 1000
Ω
Test Point
CK
(1)
(2)
CK#
CK
LOAD CIRCUIT
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE AND CURRENT WAVEFORMS
INPUTS ACTIVE AND INACTIVE TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Figure 6
Parameter Measurement Information (VDD = 1.8V ± 0.1V)