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SSD1854
Series
Rev 1.0
08/2002
SOLOMON
30
8.23 Set COM Output Scan Direction [C0~CF]
This command sets the scan direction of the COM output allowing layout flexibility in LCD
module assembly.
8.24 Exit Power Save Mode [E1]
This command releases the chip from Sleep Mode and return to normal operation.
8.25 Software Reset [E2]
This command causes some of the internal status of the chip to be initialized:
Register
Default Value
Page address
0
Column address
0
Display Start Line
0
Internal Resistor Ratio
0
Contrast
20H
Data display length
0
FRC, PWM Mode
0
White Palette
(0, 0, 0, 0)
Light Gray Palette
(0, 0, 0, 0)
Dark Gray Palette
(9, 9, 9, 9)
Black Palette
(9, 9, 9, 9)
Descriptions
GDDRAM page 0,D0
Gain = 3.2 (IRS0)
4FRC, 9PWM
8.26 Exit N-line Inversion [E4]
This command releases the chip from N-line inversion mode. The driving waveform will be
inverted once per frame after issuing this command.
8.27 Enable Scroll Buffer RAM [E6~E7]
This command is used in enable RAM page 20 and 21 for a smooth window scrolling. When this
is enabled, D0 of page 20 will appear right after the last row as defined by Set Lower Window
Corner command. The next display data after D7 of page 21 is defined by Set Upper Window
Corner command. When this is disabled, the data in RAM page 20 and 21 will not be displayed
and the display data defined by Set Upper Window Corner command will be displayed right
after the display data defined by Set Lower Window Corner command. After POR, the scroll
buffer RAM is enabled.
8.28 Set Display Data Length [E8]
This two-bytes command only valid when 3-wire SPI configuration is set by H/W input
(PS0=PS1=L). The second byte is used to indicate that a specified number display data byte(s)
(1-256) are to be transmitted. Next byte after the display data string is handled as a command.
8.29 Set Temperature Coefficient (TC) Value [E9]
This command is to set 1 out of 4 different temperature coefficients in order to match various
liquid crystal temperature grades.
8.30 Set Test Mode [F0~FF]
This command forces the driver chip into its test mode for internal testing of the chip. Under
normal operation, user should NOT use this command.