參數(shù)資料
型號(hào): SPT7935SCT
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: ADC
英文描述: 1-CH 12-BIT PROPRIETARY METHOD ADC, SERIAL ACCESS, PQFP44
封裝: TQFP-44
文件頁(yè)數(shù): 3/8頁(yè)
文件大?。?/td> 77K
代理商: SPT7935SCT
SPT
3
6/7/99
SPT7935
ELECTRICAL SPECIFICATIONS
TA=TMIN-TMAX , VDD
1=VDD2=VDD3=3.3 V, VREF-=1.15 V, VREF+=2.15 V, Common Mode Voltage=1.65 V, fCLK=20 MSPS, Bias 1=90 A,
Bias 2=9.5
A, Differential Input, Duty Cycle=50%, unless otherwise specified.
TEST
SPT7935
PARAMETERS
CONDITIONS
LEVEL
MIN
TYP
MAX
UNITS
Dynamic Performance-Continued
Signal-To-Noise Ratio
fIN = 5.0 MHz
VI
59
62
dB
fIN = 10.0 MHz
V
58
dB
Total Harmonic Distortion
fIN=5.0 MHz
VI
-68
-61
dB
fIN=10.0 MHz
V
-60
dB
Signal-To-Noise and Distortion
fIN = 5 MHz
VI
57
61
dB
fIN = 10 MHz
V
56
dB
Spurious Free Dynamic Range
fIN = 5.0 MHz
VI
62
70
dB
fIN = 10.0 MHz
V
61
dB
Differential Phase
V
0.2
Degrees
Differential Gain
V
0.5
%
Digital Inputs
Logic 1 Voltage
VI
80% VDD
Logic 0 Voltage
VI
20% VDD
Maximum Input Current Low
VIN = GND
VI
±1
A
Maximum Input Current High
VIN = VDD
VI
±1
A
Input Capacitance
V
1.8
pF
Digital Outputs
Logic 1 Voltage
IO = -2 mA
VI
85% VDD
95% VDD
V
Logic 0 Voltage
IO = +2 mA
VI
0.1
0.4
V
CLK to Output Delay Time (tD)IV
4
8
12
ns
Power Supply Requirements
Supply Voltages
VDD
1, VDD2, VDD3
IV
2.8
3.3
3.6
V
Supply Current
IDD
VI
24
30
mA
Power Dissipation
VI
79
100
mW
Power Supply Rejection Ratio (PSRR)
V
63
dB
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions: All parameters having min/
max specifications are guaranteed. The Test
Level column indicates the specific device test-
ing actually performed during production and
Quality Assurance inspection. Any blank sec-
tion in the data column indicates that the speci-
fication is not tested at the specified condition.
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