參數(shù)資料
型號(hào)： SN74ABT8952DLRG4
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
中文描述： 掃描測(cè)試設(shè)備與八進(jìn)制注冊(cè)總線收發(fā)器
文件頁(yè)數(shù)： 20/29頁(yè)
文件大小： 509K
代理商： SN74ABT8952DLRG4
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
20
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25
°
C
TYP
SN54ABT8952
MIN
SN74ABT8952
MIN
UNIT
MIN
MAX
MAX
MAX
VIK
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5 V,
II = –18 mA
IOH = –3 mA
IOH = –3 mA
IOH = –24 mA
IOH = –32 mA
IOL = 48 mA
IOL = 64 mA
–1.2
–1.2
–1.2
V
2.5
2.5
2.5
VOH
3
3
3
V
VCC= 4 5 V
VCC = 4.5 V
2
2
2*
2
VOL
VCC= 4 5 V
VCC = 4.5 V
0.55
0.55
V
0.55*
0.55
II
VCC = 5.5 V,
VI= VCCor GND
VI = VCC or GND
CLK, CLKEN,
OE, TCK
±
1
±
1
±
1
A
μ
A or B ports
±
100
10
±
100
10
±
100
10
IIH
IIL
IOZH
IOZL
Ioff
IOZPU
IOZPD
ICEX
IO§
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 0,
VCC = 0 to 2 V,
VCC = 2 V to 0,
VCC = 5.5 V,
VCC = 5.5 V,
VI = VCC
VI = GND
VO = 2.7 V
VO = 0.5 V
VI or VO
≤
4.5 V
VO = 0.5 V or 2.7 V
VO = 0.5 V or 2.7 V
VO = 5.5 V
VO = 2.5 V
TDI, TMS
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
mA
TDI, TMS
–40
–160
–40
–160
–40
–160
50
50
50
–50
±
100
±
50
±
50
50
–50
–50
±
100
±
50
±
50
50
±
50
±
50
50
Outputs high
–50
–100
–180
–50
–180
–50
–180
VCC= 5.5 V,
VCC = 5.5 V,
IO = 0,
VI = VCC or GND
A or B
ports
Outputs high
0.9
2
2
2
ICC
Outputs low
30
38
38
38
mA
Outputs disabled
0.9
2
2
2
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
VI = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
1 5
1.5
1 5
1.5
1 5
1.5
mA
ICC
Ci
Cio
Co
Control inputs
3
pF
A or B ports
10
pF
TDO
8
pF
*On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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