參數(shù)資料
型號(hào): SN65LVDT125ADBTRG4
廠商: Texas Instruments, Inc.
英文描述: LVDS 4x4 CROSSPOINT SWITCH
中文描述: LVDS的4 × 4交叉點(diǎn)開關(guān)
文件頁數(shù): 4/15頁
文件大小: 229K
代理商: SN65LVDT125ADBTRG4
SLLS595A OCTOBER 2003 REVISED FEBRUARY 2004
www.ti.com
4
CROSSPOINT LOGIC TABLES
OUTPUT CHANNEL 1
CONTROL
PINS
OUTPUT CHANNEL 2
CONTROL
PINS
OUTPUT CHANNEL 3
CONTROL
PINS
OUTPUT CHANNEL 4
CONTROL
PINS
INPUT
SELECTED
INPUT
SELECTED
INPUT
SELECTED
INPUT
SELECTED
S10
0
S11
0
1Y/1Z
1A/1B
S20
0
S21
0
2Y/2Z
1A/1B
S30
0
S31
0
3Y/3Z
1A/1B
S40
0
S41
0
4Y/4Z
1A/1B
0
1
2A/2B
0
1
2A/2B
0
1
2A/2B
0
1
2A/2B
1
0
3A/3B
1
0
3A/3B
1
0
3A/3B
1
0
3A/3B
1
1
4A/4B
1
1
4A/4B
1
1
4A/4B
1
1
4A/4B
PACKAGE DISSIPATION RATINGS
CIRCUIT BOARD
PACKAGE
MODEL
HighK(2)
TA
25
°
C POWER
RATING
DERATING FACTOR(1)
ABOVE TA = 25
°
C
15.4 mW/
°
C
TA = 85
°
C POWER
RATING
TSSOP (DBT)
(1)This is the inverse of the junction-to-ambient thermal resistance when board-mounded and with no air flow.
(2)In accordance with the HighK thermal metric definitions of EIA/JESD516
1772 mW
847 mW
THERMAL CHARACTERISTICS
PARAMETER
TEST CONDITIONS
VALUE
40.3
UNITS
θ
JB
θ
JC
Junction-to-board thermal resistance
°
C/W
Junction-to-case thermal resistance
8.5
PD
Device power dissipation
Typical
VCC = 3.3 V, TA = 25
°
C, 750 MHZ
VCC = 3.6 V, TA = 85
°
C, 750 MHZ
356
mW
Maximum
522
mW
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
UNITS
Supply voltage range, vcc
0.5 V to 4 V
S, DE
0.5 V to 4 V
Voltage range
(A, B)
0.5 V to 4 V
|VA VB| (LVDT only)
(Y, Z)
Human body model(3)
Charged-device model(4)
1 V
0.5 V to 4 V
±
3 kV
±
500 V
Electrostatic discharge
All pins
All pins
Continuous power dissipation
See Dissipation Rating Table
65
°
C to 150
°
C
Storage temperature range
(1)Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
(3)Tested in accordance with JEDEC Standard 22, Test Method A114-A.
(4)Tested in accordance with JEDEC Standard 22, Test Method C101.
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