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參數(shù)資料
| 型號(hào)： | SN65C3222DWE4 |
| 廠商： | Texas Instruments, Inc. |
| 元件分類： | 外設(shè)及接口 |
| 英文描述： | Low Power 5V RS232 Dual Driver/Receiver with 0.1?μF Capacitors; Package: SO; No of Pins: 16; Temperature Range: -40?°C to 85?°C |
| 中文描述： | 電可擦除可編程邏輯器件 |
| 文件頁數(shù)： | 4/14頁 |
| 文件大?。?/td> | 267K |
| 代理商： | SN65C3222DWE4 |
SLLS534B MAY 2002 REVISED OCTOBER 2004
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
DRIVER SECTION
electrical characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Note 4 and Figure 5)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VOH
VOL
IIH
IIL
High-level output voltage
DOUT at RL = 3 k
to GND,
DOUT at RL = 3 k
to GND,
VI = VCC
VI at GND
VCC = 3.6 V,
VCC = 5.5 V,
VCC, V+, and V = 0 V,
DIN = GND
5
5.4
V
Low-level output voltage
DIN = VCC
5
5.4
±
0.01
±
0.01
±
35
±
35
10M
V
μ
A
μ
A
High-level input current
±
1
±
1
Low-level input current
IOS
Short-circuit output current
VO = 0 V
VO = 0 V
VO =
±
2 V
VO =
±
12 V,
VO =
±
10 V,
±
60
±
90
mA
ro
Output resistance
300
Ioff
Output leakage current
PWRDOWN = GND
VCC = 3 V to 3.6 V
VCC = 4.5 V to 5.5 V
±
25
±
25
μ
A
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25
°
C.
Short-circuit durations should be controlled to prevent exceeding the device absolute power-dissipation ratings, and not more than one output
should be shorted at a time.
NOTE 4: Test conditions are C1C4 = 0.1
μ
F at VCC = 3.3 V
±
0.3 V; C1 = 0.047
μ
F, C2C4 = 0.33
μ
F at VCC = 5 V
±
0.5 V.
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Note 4 and Figure 4)
PARAMETER
TEST CONDITIONS
CL = 1000 pF
CL = 250 pF,
CL = 1000 pF,
RL = 3 k
to 7 k
,
See Figure 2
MIN
250
TYP
MAX
UNIT
Maximum data rate
(see Figure 1)
RL = 3 k
,
One DOUT switching
VCC = 3 V to 4.5 V
VCC = 4.5 V to 5.5 V
1000
kbit/s
1000
tsk(p)
Pulse skew§
CL = 150 pF to 2500 pF
300
ns
SR(tr)
Slew rate,
transition region
(see Figure 1)
RL = 3 k
to 7 k
,
VCC = 3.3 V
CL = 150 pF to 1000 pF
18
150
V/
μ
s
All typical values are at VCC = 3.3 V or VCC = 5 V, and TA = 25
°
C.
§Pulse skew is defined as |tPLH tPHL| of each channel of the same device.
NOTE 4: Test conditions are C1C4 = 0.1
μ
F at VCC = 3.3 V
±
0.3 V; C1 = 0.047
μ
F, C2C4 = 0.33
μ
F at VCC = 5 V
±
0.5 V.
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