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參數(shù)資料
| 型號(hào)： | SN54F257J |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Replaced by BQ4015 : 256Kx8 Nonvolatile SRAM, 5% Voltage Tolerance 32-DIP MODULE 0 to 70 |
| 中文描述： | 四2線1線數(shù)據(jù)選擇器/多路復(fù)用3態(tài)輸出 |
| 文件頁(yè)數(shù)： | 1/5頁(yè) |
| 文件大?。?/td> | 74K |
| 代理商： | SN54F257J |
SN54F257, SN74F257
QUADRUPLE 2-LINE TO 1-LINE DATA SELECTORS/MULTIPLEXERS
WITH 3-STATE OUTPUTS
SDFS065A – D2932, MARCH 1987 – REVISED OCTOBER 1993
Copyright
1993, Texas Instruments Incorporated
2–1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
3-State Outputs Interface Directly With
System Bus
Provides Bus Interface From Multiple
Sources in High-Performance Systems
Package Options Include Plastic
Small-Outline Packages, Ceramic Chip
Carriers, and Standard Plastic and Ceramic
300-mil DIPs
description
The
′
F257 is designed to multiplex signals from
4-bit data sources to 4-output data lines in
bus-organized systems. The 3-state outputs will
not load the data lines when the output enable
(OE) input is at a high logic level.
The SN54F257 is characterized for operation over
the full military temperature range of –55
°
C to
125
°
C. The SN74F257 is characterized for
operation from 0
°
C to 70
°
C.
FUNCTION TABLE
INPUTS
OUTPUT
Y
OE
H
A/B
X
A
X
B
X
Z
L
L
L
X
L
L
L
H
X
H
L
H
X
L
L
L
H
X
H
H
logic symbol
OE
MUX
2
1A
1
3
1B
EN
15
G1
1
1Y
4
5
2A
6
2B
2Y
7
11
3A
10
3B
3Y
9
14
4A
13
4B
4Y
12
A/B
1
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
SN54F257 . . . J PACKAGE
SN74F257 . . . D OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
4B
NC
4Y
3A
1B
1Y
NC
2A
2B
SN54F257 . . . FK PACKAGE
(TOP VIEW)
1
A
N
3
3
O
2
G
N
NC – No internal connection
V
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
A/B
1A
1B
1Y
2A
2B
2Y
GND
V
CC
OE
4A
4B
4Y
3A
3B
3Y
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54F258 | Replaced by BQ4015Y : 256KX8 NONVOLATILE SRAM, 10% VOLTAGE TOLERANCE 32-DIP MODULE 0 TO 70 |
| SN54F258FK | Replaced by BQ4015Y : 256Kx8 Nonvolatile SRAM, 10% Voltage Tolerance 32-DIP MODULE 0 to 70 |
| SN54F258J | 512Kx8 Nonvolatile SRAM, 5% Voltage Tolerance 32-DIP MODULE 0 to 70 |
| SN54F27FK | TRIPLE 3-INPUT POSITIVE-NOR GATES |
| SN54F30FK | RTC IC With 114x8 NVSRAM and NVSRAM Control 24-PDIP 0 to 70 |
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