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參數(shù)資料
| 型號： | SN54ABT8952FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設(shè)備與八進(jìn)制注冊總線收發(fā)器 |
| 文件頁數(shù)： | 2/24頁 |
| 文件大?。?/td> | 365K |
| 代理商： | SN54ABT8952FK |
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Data flow in each direction is controlled by clock (CLKAB and CLKBA), clock-enable (CLKENAB and
CLKENBA), and output-enable (OEAB and OEBA) inputs. For A-to-B data flow, A-bus data is stored in the
associated registers on the low-to-high transition of CLKAB, provided that CLKENAB is low. Otherwise, if
CLKENAB is high or CLKAB remains at a static low or high level, the register contents are not changed. When
OEAB is low, the B outputs are active. When OEAB is high, the B outputs are in the high-impedance state.
Control for B-to-A data flow is similar to that for A-to-B, but uses CLKBA, CLKENBA, and OEBA.
In the test mode, the normal operation of the SCOPE
registered bus transceivers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO),
test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions
such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from
data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54ABT8952 is characterized for operation over the full military temperature range of –55
°
C to 125
°
C.
The SN74ABT8952 is characterized for operation from –40
°
C to 85
°
C.
FUNCTION TABLE
(normal mode, each register)
INPUTS
OUTPUT
B
OEAB
CLKENAB
CLKAB
↑
↑
X
A
L
L
L
L
L
L
H
H
L
H
X
B0
B0
Z
L
X
L
X
H
X
X
X
A-to-B data flow is shown; B-to-A data flow is similar
but uses OEBA, CLKENBA, and CLKBA.
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| SN54ABT8952JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
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| SN54ABTE16245 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
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