參數(shù)資料
型號(hào)： SN54ABT8952
廠(chǎng)商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
中文描述： 掃描測(cè)試設(shè)備與八進(jìn)制注冊(cè)總線(xiàn)收發(fā)器
文件頁(yè)數(shù)： 9/24頁(yè)
文件大?。?/td> 365K
代理商： SN54ABT8952
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 38 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and two BSCs for each normal-function I/O pin (one for input data and one for output
data). The BSR is used 1) to store test data that is to be applied internally to the inputs of the normal on-chip
logic and/or externally to the device output pins, and/or 2) to capture data that appears internally at the outputs
of the normal on-chip logic and/or externally at the device input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR can change during Run-Test/Idle as determined by the current instruction. At power up or
in Test-Logic-Reset, the value of each BSC is reset to logic 0 except BSCs 37–36, which are reset to logic 1.
The BSR order of scan is from TDI through bits 37–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
37
OEAB
31
A8-I
23
A8-O
15
B8-I
7
B8-O
36
OEBA
30
A7-I
22
A7-O
14
B7-I
6
B7-O
35
CLKAB
29
A6-I
21
A6-O
13
B6-I
5
B6-O
34
CLKBA
28
A5-I
20
A5-O
12
B5-I
4
B5-O
33
CLKENAB
27
A4-I
19
A4-O
11
B4-I
3
B4-O
32
CLKENBA
26
A3-I
18
A3-O
10
B3-I
2
B3-O
––
––
25
A2-I
17
A2-O
9
B2-I
1
B2-O
––
––
24
A1-I
16
A1-O
8
B1-I
0
B1-O
相關(guān)PDF資料
PDF描述
SN54ABT8952FK SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952JT SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABTE16245WD 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74ABTE16245DGG 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54ABT8952_07 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952FK 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952JT 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8996 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
SN54ABT8996FK 制造商:Texas Instruments 功能描述:ADDRESSABLE SCAN PORT 28LCCC - Rail/Tube
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