參數(shù)資料
型號(hào)： SN54ABT8952
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
中文描述： 掃描測(cè)試設(shè)備與八進(jìn)制注冊(cè)總線收發(fā)器
文件頁(yè)數(shù)： 4/24頁(yè)
文件大?。?/td> 365K
代理商： SN54ABT8952
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
A1–A8
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1–B8
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CLKAB, CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
CLKENAB, CLKENBA
Normal-function clock-enable inputs. See function table for normal-mode logic.
GND
Ground
OEAB, OEBA
Normal-function output-enable inputs. See function table for normal-mode logic.
TCK
Test clock. One of four pins required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous
to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK.
TDI
Test data input. One of four pins required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left
unconnected.
TDO
Test data output. One of four pins required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four pins required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54ABT8952_07 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952FK 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952JT 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8996 制造商:TI 制造商全稱(chēng):Texas Instruments 功能描述:10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
SN54ABT8996FK 制造商:Texas Instruments 功能描述:ADDRESSABLE SCAN PORT 28LCCC - Rail/Tube
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